Patent Assignment Details
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| Reel/Frame: | 020993/0066 | |
| Pages: | 3 |
| | Recorded: | 05/16/2008 | | |
| Attorney Dkt #: | SUZU1870 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11986450
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Filing Dt:
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11/21/2007
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Publication #:
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Pub Dt:
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08/28/2008
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Title:
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Method for fabricating semiconductor device to which test is performed at wafer level and apparatus for testing semiconductor device
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Assignee
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| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO 105-8001, JAPAN |
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Correspondence name and address
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SPRINKLE IP LAW GROUP
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1301 W. 25TH STREET
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SUITE 408
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AUSTIN, TX 78705
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