Patent Assignment Details
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| Reel/Frame: | 021028/0858 | |
| Pages: | 4 |
| | Recorded: | 06/02/2008 | | |
| Attorney Dkt #: | Q108480 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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04/12/2011
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Application #:
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12131582
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Filing Dt:
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06/02/2008
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Publication #:
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Pub Dt:
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12/04/2008
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Title:
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METHOD OF DETERMINING DEFECTS IN PHOTOMASK
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Assignees
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| 1-1, ICHIGAYA-KAGACHO 1-CHOME |
| SHINJUKU-KU, TOKYO, JAPAN 162-8001 |
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| 6-2, OTEMACHI 2-CHOME |
| CHIYODA-KU, TOKYO, JAPAN 100-0004 |
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Correspondence name and address
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SUGHRUE MION, PLLC
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2100 PENNSYLVANIA AVENUE, N.W.
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WASHINGTON, DC 20037-3213
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