Patent Assignment Details
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| Reel/Frame: | 021086/0988 | |
| Pages: | 2 |
| | Recorded: | 06/12/2008 | | |
| Attorney Dkt #: | 07826/LH |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11999358
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Filing Dt:
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12/05/2007
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Publication #:
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Pub Dt:
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10/09/2008
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Title:
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Defect inspecting apparatus and defect-inspecting method
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Assignee
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| 43-2 HATAGAYA 2-CHOME, SHIBUYA-KU |
| TOKYO,, JAPAN |
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Correspondence name and address
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FISHAUF, HOLTZ
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220 5TH AVE FL 16
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220 5TH AVE FL 16
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NEW YORK, NY 10001-7708
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