Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 021832/0369 | |
| Pages: | 9 |
| | Recorded: | 11/07/2008 | | |
| Attorney Dkt #: | 2008_1450A |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
|
Issue Dt:
|
07/19/2011
|
Application #:
|
12222992
|
Filing Dt:
|
08/21/2008
|
|
Publication #:
|
|
Pub Dt:
|
03/05/2009
| | | | |
|
Title:
|
FAULT TEST APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR DEVICE UNDER TEST USING FAULT EXCITATION FUNCTION
|
|
|
Assignee
|
|
|
|
|
| 3-17-2, SHIN-YOKOHAMA, KOHOKU-KU |
| YOKOHAMA-SHI, KANAGAWA 222-0033, JAPAN |
|
|
Correspondence name and address
|
| |
WENDEROTH, LIND & PONACK, L.L.P.
|
| |
ATTN: MICHAEL S. HUPPERT, ESQ.
|
| |
2033 K STREET, N.W., SUITE 800
|
| |
WASHINGTON, DC 20006-1021
|
Search Results as of:
04/27/2024 02:48 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
