Patent Assignment Details
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| Reel/Frame: | 022325/0706 | |
| Pages: | 2 |
| | Recorded: | 02/19/2009 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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03/27/2012
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Application #:
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12379371
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Filing Dt:
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02/19/2009
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Publication #:
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Pub Dt:
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12/03/2009
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Title:
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TEST APPARATUS, TEST METHOD, AND INTEGRATED CIRCUIT
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Assignee
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| 1-1, KAMIKODANAKA 4-CHOME NAKAHARA-KU, KAWASAKI-SHI |
| KANAGAWA 211-8588, JAPAN |
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Correspondence name and address
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STAAS & HALSEY LLP
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ATTN: H. J. STAAS
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1201 NEW YORK AVENUE, N.W., SUITE 700
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WASHINGTON, D.C. 20005
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