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Patent Assignment Details
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Reel/Frame:022379/0951   Pages: 2
Recorded: 03/11/2009
Attorney Dkt #:08411.0136
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
12400701
Filing Dt:
03/09/2009
Publication #:
Pub Dt:
09/17/2009
Title:
METHOD OF MEASURING WAVEFRONT ERROR, METHOD OF CORRECTING WAVEFRONT ERROR, AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE
Assignor
1
Exec Dt:
03/03/2009
Assignee
1
1-1, SHIBAURA 1-CHOME, MINATO-KU
TOKYO, JAPAN 105-8001
Correspondence name and address
FINNEGAN HENDERSON ET AL.
901 NEW YORK AVE., NW
WASHINGTON, DC 20001

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