Patent Assignment Details
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Reel/Frame: | 022507/0283 | |
| Pages: | 2 |
| | Recorded: | 04/06/2009 | | |
Attorney Dkt #: | T&A-6327 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/15/2009
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Application #:
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12062940
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Filing Dt:
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04/04/2008
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Publication #:
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Pub Dt:
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10/09/2008
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Title:
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SEMICONDUCTOR WAFER INSPECTION APPARATUS
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Assignee
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1-24-14, NISHI SHINBASHI |
MINATO-KU, TOKYO, JAPAN |
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Correspondence name and address
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MATTINGLY & MALUR, P.C.
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1800 DIAGONAL RD.
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SUITE 370
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ALEXANDRIA, VA 22314
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