Patent Assignment Details
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| Reel/Frame: | 022794/0894 | |
| Pages: | 5 |
| | Recorded: | 05/28/2009 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/05/2012
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Application #:
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12455075
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Filing Dt:
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05/28/2009
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Publication #:
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Pub Dt:
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12/03/2009
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Title:
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TEST CIRCUIT AND METHOD FOR AN ELECTRONIC DEVICE
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Assignees
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| 1F, E4 BUILDING, E BLOCK, FOXCONN SCIENCE PARK |
| LONGHUA TOWN, BAO'AN DISTRICT |
| SHENZHEN CITY GUANGDONG PROVINCE, CHINA 518109 |
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| NO. 160 KESYUE RD., CHU-NAN SITE, HSINCHU SCIENCE PARK |
| CHU-NAN 350 |
| MIAO-LI COUNTY, TAIWAN R.O.C. |
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Correspondence name and address
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WEI TE CHUNG
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(FOXCONN INTERNATIONAL, INC.)
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1650 MEMOREX DRIVE
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SANTA CLARA, CA 95050
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