Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Reel/Frame: | 022949/0752 | |
| Pages: | 3 |
| | Recorded: | 07/14/2009 | | |
Attorney Dkt #: | 8027-1089 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
Total properties:
1
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
12502286
|
Filing Dt:
|
07/14/2009
|
Publication #:
|
|
Pub Dt:
|
01/21/2010
| | | | |
Title:
|
PROBER AND SEMICONDUCTOR WAFER TESTING METHOD USING THE SAME
|
|
Assignees
|
|
|
2-1, YAESU 2-CHOME, CHUO-KU |
TOKYO, JAPAN |
|
|
|
4TH FLOOR, KAKIYA BLDG., 2-7-17 SHIN-YOKOHAMA, KOHOKU-KU |
YOKOHAMA-SHI, KANAGAWA-KEN, JAPAN |
|
Correspondence name and address
|
|
YOUNG & THOMPSON
|
|
209 MADISON STREET
|
|
SUITE 500
|
|
ALEXANDRIA, VA 22314
|
Search Results as of:
05/21/2024 07:26 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|