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Total properties:
22
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Patent #:
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Issue Dt:
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07/08/2003
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Application #:
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09796003
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Filing Dt:
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02/27/2001
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Title:
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SYSTEMS FOR PROVIDING ZERO LATENCY, NON-MODULO LOOPING AND BRANCHING OF TEST PATTERN DATA FOR AUTOMATIC TEST EQUIPMENT
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Patent #:
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Issue Dt:
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04/18/2006
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Application #:
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10173199
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Filing Dt:
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06/14/2002
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Title:
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SYSTEM FOR DYNAMIC RE-ALLOCATION OF TEST PATTERN DATA FOR PARALLEL AND SERIAL TEST DATA PATTERNS
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Patent #:
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Issue Dt:
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04/12/2005
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Application #:
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10210976
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Filing Dt:
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08/02/2002
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Title:
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DYNAMICALLY RECONFIGURABLE PRECISION SIGNAL DELAY TEST SYSTEM FOR AUTOMATIC TEST EQUIPMENT
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Patent #:
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Issue Dt:
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06/15/2004
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Application #:
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10356048
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Filing Dt:
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01/31/2003
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Title:
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PROGRAMMABLE PRECISION CURRENT CONTROLLING APPARATUS
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Patent #:
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Issue Dt:
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01/04/2005
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Application #:
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10429099
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Filing Dt:
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05/01/2003
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Title:
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SYSTEMS FOR PROVIDING ZERO LATENCY, NON-MODULO LOOPING AND BRANCHING OF TEST PATTERN DATA FOR AUTOMATIC TEST EQUIPMENT
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Patent #:
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Issue Dt:
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05/31/2005
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Application #:
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10613848
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Filing Dt:
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07/03/2003
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Title:
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DIGITALLY CONTROLLED MODULAR POWER SUPPLY FOR AUTOMATED TEST EQUIPMENT
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Patent #:
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Issue Dt:
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05/16/2006
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Application #:
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10642000
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Filing Dt:
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08/15/2003
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Title:
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METHOD AND SYSTEM FOR AUTOMATICALLY DETERMINING A TESTING ORDER WHEN EXECUTING A TEST FLOW
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10741110
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Filing Dt:
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12/19/2003
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Publication #:
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Pub Dt:
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09/15/2005
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Title:
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Method and system for delay defect location when testing digital semiconductor devices
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Patent #:
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Issue Dt:
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03/14/2006
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Application #:
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10754968
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Filing Dt:
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01/09/2004
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Title:
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DYNAMICALLY RECONFIGURABLE PRECISION SIGNAL DELAY TEST SYSTEM FOR AUTOMATIC TEST EQUIPMENT
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Patent #:
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Issue Dt:
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02/22/2005
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Application #:
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10859642
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Filing Dt:
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06/02/2004
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Title:
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PROGRAMMABLE PRECISION CURRENT CONTROLLING APPARATUS
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Patent #:
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Issue Dt:
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09/26/2006
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Application #:
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10917898
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Filing Dt:
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08/12/2004
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Title:
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DYNAMICALLY RECONFIGURABLE PRECISION SIGNAL DELAY TEST SYSTEM FOR AUTOMATIC TEST EQUIPMENT
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Patent #:
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Issue Dt:
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12/26/2006
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Application #:
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11087157
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Filing Dt:
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03/22/2005
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Title:
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DIGITALLY CONTROLLED MODULAR POWER SUPPLY FOR AUTOMATED TEST EQUIPMENT
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Patent #:
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Issue Dt:
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08/23/2011
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Application #:
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11563612
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Filing Dt:
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11/27/2006
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Publication #:
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Pub Dt:
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05/29/2008
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Title:
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SYSTEM AND METHOD FOR DEVICE PERFORMANCE CHARACTERIZATION IN PHYSICAL AND LOGICAL DOMAINS WITH AC SCAN TESTING
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Patent #:
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Issue Dt:
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05/28/2013
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Application #:
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11565616
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Filing Dt:
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11/30/2006
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Publication #:
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Pub Dt:
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05/01/2008
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Title:
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PROCESS FOR IMPROVING DESIGN LIMITED YIELD BY EFFICIENTLY CAPTURING AND STORING PRODUCTION TEST DATA FOR ANALYSIS USING CHECKSUMS, HASH VALUES, OR DIGITAL FAULT SIGNATURES
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Patent #:
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Issue Dt:
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07/28/2009
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Application #:
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11609899
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Filing Dt:
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12/12/2006
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Publication #:
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Pub Dt:
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06/12/2008
| | | | |
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Title:
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PROCESS FOR IDENTIFYING THE LOCATION OF A BREAK IN A SCAN CHAIN IN REAL TIME
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Patent #:
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Issue Dt:
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01/19/2010
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Application #:
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11680134
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Filing Dt:
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02/28/2007
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Publication #:
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Pub Dt:
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08/28/2008
| | | | |
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Title:
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APPARATUS FOR LOCATING A DEFECT IN A SCAN CHAIN WHILE TESTING DIGITAL LOGIC
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Patent #:
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Issue Dt:
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12/24/2013
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Application #:
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11682314
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Filing Dt:
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03/06/2007
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Publication #:
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Pub Dt:
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04/17/2008
| | | | |
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Title:
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PROCESS FOR IMPROVING DESIGN-LIMITED YIELD BY LOCALIZING POTENTIAL FAULTS FROM PRODUCTION TEST DATA
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Patent #:
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Issue Dt:
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11/15/2011
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Application #:
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11850342
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Filing Dt:
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09/05/2007
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Publication #:
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Pub Dt:
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02/04/2010
| | | | |
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Title:
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METHOD FOR OPERATING A SECURE SEMICONDUCTOR IP SERVER TO SUPPORT FAILURE ANALYSIS
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Patent #:
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|
Issue Dt:
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12/14/2010
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Application #:
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11931847
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Filing Dt:
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10/31/2007
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Publication #:
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Pub Dt:
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04/30/2009
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Title:
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LOCATING HOLD TIME VIOLATIONS IN SCAN CHAINS BY GENERATING PATTERNS ON ATE
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Patent #:
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Issue Dt:
|
01/04/2011
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Application #:
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11941026
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Filing Dt:
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11/15/2007
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Publication #:
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Pub Dt:
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05/21/2009
| | | | |
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Title:
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DYNAMIC MASK MEMORY FOR SERIAL SCAN TESTING
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|
|
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Patent #:
|
|
Issue Dt:
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08/30/2011
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Application #:
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12058768
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Filing Dt:
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03/31/2008
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Publication #:
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Pub Dt:
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04/30/2009
| | | | |
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Title:
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METHODS FOR ANALYZING SCAN CHAINS, AND FOR DETERMINING NUMBERS OR LOCATIONS OF HOLD TIME FAULTS IN SCAN CHAINS
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|
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Patent #:
|
|
Issue Dt:
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02/28/2012
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Application #:
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12074015
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Filing Dt:
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02/28/2008
|
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Publication #:
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Pub Dt:
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09/04/2008
| | | | |
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Title:
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METHODS AND APPARATUS FOR ESTIMATING A POSITION OF A STUCK-AT DEFECT IN A SCAN CHAIN OF A DEVICE UNDER TEST
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