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Patent Assignment Details

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Reel/Frame:	023519/0078			Pages:	5
		Recorded:	11/15/2009
Attorney Dkt #:	INFINEON ASSIGNMENTS
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 25

Patent #:	5308783	Issue Dt:	05/03/1994	Application #:	07991776	Filing Dt:	12/16/1992
Title:	PROCESS FOR THE MANUFACTURE OF A HIGH DENSITY CELL ARRAY OF GAIN MEMORY CELLS

Patent #:	5444398	Issue Dt:	08/22/1995	Application #:	07995639	Filing Dt:	12/17/1992
Title:	DECODED-SOURCE SENSE AMPLIFIER WITH SPECIAL COLUMN SELECT DRIVER VOLTAGE

Patent #:	5847591	Issue Dt:	12/08/1998	Application #:	08829256	Filing Dt:	03/31/1997
Title:	VOLTAGE DETECTION CIRCUIT AND INTERNAL VOLTAGE CLAMP CIRCUIT

Patent #:	5932919	Issue Dt:	08/03/1999	Application #:	08856336	Filing Dt:	05/14/1997
Title:	MOSFETS WITH IMPROVED SHORT CHANNEL EFFECTS

Patent #:	5979244	Issue Dt:	11/09/1999	Application #:	09034517	Filing Dt:	03/04/1998
Title:	METHOD AND APPARATUS FOR EVALUATING INTERNAL FILM STRESS AT HIGH LATERAL RESOLUTION

Patent #:	6558883	Issue Dt:	05/06/2003	Application #:	09801413	Filing Dt:	03/08/2001
Publication #:	US20020127501	Pub Dt:	09/12/2002
Title:	APPARATUS AND METHOD FOR PATTERNING A SEMICONDUCTOR WAFER

Patent #:	6529031	Issue Dt:	03/04/2003	Application #:	09876706	Filing Dt:	06/07/2001
Publication #:	US20010052789	Pub Dt:	12/20/2001
Title:	INTEGRATED CIRCUIT CONFIGURATION FOR TESTING TRANSISTORS, AND A SEMICONDUCTOR WAFER HAVING SUCH A CIRCUIT CONFIGURATION

Patent #:	6556492	Issue Dt:	04/29/2003	Application #:	09907695	Filing Dt:	07/18/2001
Publication #:	US20020012283	Pub Dt:	01/31/2002
Title:	SYSTEM FOR TESTING FAST SYNCHRONOUS SEMICONDUCTOR CIRCUITS

Patent #:	6706616	Issue Dt:	03/16/2004	Application #:	09914749	Filing Dt:	01/14/2002
Title:	METHOD FOR IMPROVING THERMAL PROCESS STEPS

Patent #:	6750671	Issue Dt:	06/15/2004	Application #:	09915984	Filing Dt:	07/25/2001
Publication #:	US20020021141	Pub Dt:	02/21/2002
Title:	APPARATUS FOR TESTING SEMICONDUCTOR DEVICES

Patent #:	6614243	Issue Dt:	09/02/2003	Application #:	09947295	Filing Dt:	09/05/2001
Publication #:	US20020084791	Pub Dt:	07/04/2002
Title:	MEASUREMENT PROBE FOR DETECTING ELECTRICAL SIGNALS IN AN INTEGRATED SEMICONDUCTOR CIRCUIT

Patent #:	6724181	Issue Dt:	04/20/2004	Application #:	09992290	Filing Dt:	11/16/2001
Publication #:	US20020075030	Pub Dt:	06/20/2002
Title:	METHOD OF CALIBRATING A TEST SYSTEM FOR SEMICONDUCTOR COMPONENTS, AND TEST SUBSTRATE

Patent #:	6762611	Issue Dt:	07/13/2004	Application #:	10010504	Filing Dt:	12/05/2001
Publication #:	US20020089341	Pub Dt:	07/11/2002
Title:	TEST CONFIGURATION AND TEST METHOD FOR TESTING A PLURALITY OF INTEGRATED CIRCUITS IN PARALLEL

Patent #:	6773934	Issue Dt:	08/10/2004	Application #:	10105590	Filing Dt:	03/25/2002
Publication #:	US20020137238	Pub Dt:	09/26/2002
Title:	METHOD FOR RELEASABLE CONTACT-CONNECTION OF A PLURALITY OF INTEGRATED SEMICONDUCTOR MODULES ON A WAFER

Patent #:	6784683	Issue Dt:	08/31/2004	Application #:	10131374	Filing Dt:	04/24/2002
Publication #:	US20020153918	Pub Dt:	10/24/2002
Title:	CIRCUIT CONFIGURATION FOR SELECTIVELY TRANSMITTING INFORMATION ITEMS FROM A MEASURING DEVICE TO CHIPS ON A WAFER DURING CHIP FABRICATION

Patent #:	6677745	Issue Dt:	01/13/2004	Application #:	10134132	Filing Dt:	04/29/2002
Publication #:	US20020158625	Pub Dt:	10/31/2002
Title:	TEST APPARATUS FOR PARALLEL TESTING A NUMBER OF ELECTRONIC COMPONENTS AND A METHOD FOR CALIBRATING THE TEST APPARATUS

Patent #:	6614248	Issue Dt:	09/02/2003	Application #:	10186659	Filing Dt:	07/01/2002
Publication #:	US20030001602	Pub Dt:	01/02/2003
Title:	TESTER APPARATUS FOR ELECTRONIC COMPONENTS

Patent #:	6731552	Issue Dt:	05/04/2004	Application #:	10206299	Filing Dt:	07/26/2002
Publication #:	US20030021170	Pub Dt:	01/30/2003
Title:	INTEGRATED DYNAMIC MEMORY AND OPERATING METHOD

Patent #:	6781398	Issue Dt:	08/24/2004	Application #:	10208252	Filing Dt:	07/30/2002
Publication #:	US20030035400	Pub Dt:	02/20/2003
Title:	CIRCUIT FOR TESTING AN INTEGRATED CIRCUIT

Patent #:	6703844	Issue Dt:	03/09/2004	Application #:	10223899	Filing Dt:	08/20/2002
Publication #:	US20030034784	Pub Dt:	02/20/2003
Title:	METHOD FOR DETERMINING THE TRANSIT TIME OF ELECTRICAL SIGNALS ON PRINTED CIRCUIT BOARDS USING AUTOMATIC STANDARD TEST EQUIPMENT

Patent #:	6850448	Issue Dt:	02/01/2005	Application #:	10386148	Filing Dt:	03/11/2003
Publication #:	US20030214858	Pub Dt:	11/20/2003
Title:	TEMPERATURE-DEPENDENT REFRESH CYCLE FOR DRAM

Patent #:	6853206	Issue Dt:	02/08/2005	Application #:	10736356	Filing Dt:	12/15/2003
Publication #:	US20040124863	Pub Dt:	07/01/2004
Title:	METHOD AND PROBE CARD CONFIGURATION FOR TESTING A PLURALITY OF INTEGRATED CIRCUITS IN PARALLEL

Patent #:	6973008	Issue Dt:	12/06/2005	Application #:	10834416	Filing Dt:	04/29/2004
Publication #:	US20050002220	Pub Dt:	01/06/2005
Title:	APPARATUS FOR FLEXIBLE DEACTIVATION OF WORD LINES OF DYNAMIC MEMORY MODULES AND METHOD THEREFOR

Patent #:	6970006	Issue Dt:	11/29/2005	Application #:	10965513	Filing Dt:	10/14/2004
Publication #:	US20050046412	Pub Dt:	03/03/2005
Title:	APPARATUS FOR THE AUTOMATED TESTING, CALIBRATION AND CHARACTERIZATION OF TEST ADAPTERS

Assignor

Exec Dt:

09/05/2006

Assignee

GUSTAV-HEINEMANN-RING 212

MUNICH, GERMANY

Correspondence name and address
	MOSAID TECHNOLOGIES INCORPORATED
	11 HINES ROAD
	SUITE 203
	OTTAWA, K2K 2X1 CANADA

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