Patent Assignment Details
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Reel/Frame: | 023924/0229 | |
| Pages: | 5 |
| | Recorded: | 02/11/2010 | | |
Attorney Dkt #: | 07394UMC-US |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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10/09/2012
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Application #:
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12703949
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Filing Dt:
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02/11/2010
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Publication #:
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Pub Dt:
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08/11/2011
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Title:
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ALTERNATING CURRENT (AC) STRESS TEST CIRCUIT, METHOD FOR EVALUATING AC STRESS INDUCED HOT CARRIER INJECTION (HCI) DEGRADATION, AND TEST STRUCTURE FOR HCI DEGRADATION EVALUATION
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Assignee
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NO. 3, LI-HSIN RD. II, SCIENCE-BASED INDUSTRIAL PARK |
HSINCHU, TAIWAN |
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Correspondence name and address
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CHUN-MING SHIH
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13611 NORTHBOURNE DR.
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CENTREVILLE, VA 20120
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