USPTO Assignments on the Web

	United States Patent and Trademark Office
	Home\|Site Index\|Search\|Guides\|Contacts\|eBusiness\|eBiz alerts\|News\|Help

Patent Assignment Details

NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:	024342/0790			Pages:	6
		Recorded:	05/06/2010
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 18

Patent #:	6977375	Issue Dt:	12/20/2005	Application #:	09789180	Filing Dt:	02/19/2001
Publication #:	US20020015143	Pub Dt:	02/07/2002
Title:	MULTI-BEAM MULTI-COLUMN ELECTRON BEAM INSPECTION SYSTEM

Patent #:	6872958	Issue Dt:	03/29/2005	Application #:	10059048	Filing Dt:	01/28/2002
Publication #:	US20020127050	Pub Dt:	09/12/2002
Title:	PLATFORM POSITIONING SYSTEM

Patent #:	6738506	Issue Dt:	05/18/2004	Application #:	10125054	Filing Dt:	04/17/2002
Publication #:	US20020167487	Pub Dt:	11/14/2002
Title:	IMAGE PROCESSING SYSTEM FOR MULTI-BEAM INSPECTION

Patent #:	6777675	Issue Dt:	08/17/2004	Application #:	10126943	Filing Dt:	04/18/2002
Publication #:	US20020153483	Pub Dt:	10/24/2002
Title:	DETECTOR OPTICS FOR ELECTRON BEAM INSPECTION SYSTEM

Patent #:	6734428	Issue Dt:	05/11/2004	Application #:	10222759	Filing Dt:	08/15/2002
Publication #:	US20030066963	Pub Dt:	04/10/2003
Title:	MULTI-BEAM MULTI-COLUMN ELECTRON BEAM INSPECTION SYSTEM

Patent #:	7941237	Issue Dt:	05/10/2011	Application #:	10589097	Filing Dt:	11/09/2007
Publication #:	US20080232939	Pub Dt:	09/25/2008
Title:	FLAT PANEL DISPLAY SUBSTRATE TESTING SYSTEM

Patent #:	6844550	Issue Dt:	01/18/2005	Application #:	10630619	Filing Dt:	07/29/2003
Title:	MULTI-BEAM MULTI-COLUMN ELECTRON BEAM INSPECTION SYSTEM

Patent #:	7122795	Issue Dt:	10/17/2006	Application #:	10833949	Filing Dt:	04/27/2004
Publication #:	US20050001165	Pub Dt:	01/06/2005
Title:	DETECTOR OPTICS FOR CHARGED PARTICLE BEAM INSPECTION SYSTEM

Patent #:	6943351	Issue Dt:	09/13/2005	Application #:	10842849	Filing Dt:	05/10/2004
Publication #:	US20050001178	Pub Dt:	01/06/2005
Title:	MULTI-COLUMN CHARGED PARTICLE OPTICS ASSEMBLY

Patent #:	7462848	Issue Dt:	12/09/2008	Application #:	10962049	Filing Dt:	10/07/2004
Publication #:	US20060145097	Pub Dt:	07/06/2006
Title:	OPTICS FOR GENERATION OF HIGH CURRENT DENSITY PATTERNED CHARGED PARTICLE BEAMS

Patent #:	7227142	Issue Dt:	06/05/2007	Application #:	11093000	Filing Dt:	03/28/2005
Publication #:	US20060054817	Pub Dt:	03/16/2006
Title:	DUAL DETECTOR OPTICS FOR SIMULTANEOUS COLLECTION OF SECONDARY AND BACKSCATTERED ELECTRONS

Patent #:	7435956	Issue Dt:	10/14/2008	Application #:	11225376	Filing Dt:	09/12/2005
Publication #:	US20060145087	Pub Dt:	07/06/2006
Title:	APPARATUS AND METHOD FOR INSPECTION AND TESTING OF FLAT PANEL DISPLAY SUBSTRATES

Patent #:	7456402	Issue Dt:	11/25/2008	Application #:	11355256	Filing Dt:	02/14/2006
Publication #:	US20060169899	Pub Dt:	08/03/2006
Title:	DETECTOR OPTICS FOR MULTIPLE ELECTRON BEAM TEST SYSTEM

Patent #:	8242457	Issue Dt:	08/14/2012	Application #:	12050035	Filing Dt:	03/17/2008
Publication #:	US20080224063	Pub Dt:	09/18/2008
Title:	CHARGED PARTICLE OPTICS WITH AZIMUTHALLY-VARYING THIRD-ORDER ABERRATIONS FOR GENERATION OF SHAPED BEAMS

Patent #:	7928404	Issue Dt:	04/19/2011	Application #:	12120174	Filing Dt:	05/13/2008
Publication #:	US20090206272	Pub Dt:	08/20/2009
Title:	VARIABLE-RATIO DOUBLE-DEFLECTION BEAM BLANKER

Patent #:	8384048	Issue Dt:	02/26/2013	Application #:	12146331	Filing Dt:	06/25/2008
Publication #:	US20080315112	Pub Dt:	12/25/2008
Title:	CHARGED PARTICLE BEAM DEFLECTION METHOD WITH SEPARATE STAGE TRACKING AND STAGE POSITIONAL ERROR SIGNALS

Patent #:	NONE	Issue Dt:		Application #:	12209882	Filing Dt:	09/12/2008
Publication #:	US20090008579	Pub Dt:	01/08/2009
Title:	ELECTRON BEAM LITHOGRAPHY APPARATUS AND DESIGN METHOD OF PATTERNED BEAM-DEFINING APERTURE

Patent #:	7786454	Issue Dt:	08/31/2010	Application #:	12210103	Filing Dt:	09/12/2008
Publication #:	US20090057577	Pub Dt:	03/05/2009
Title:	OPTICS FOR GENERATION OF HIGH CURRENT DENSITY PATTERNED CHARGED PARTICLE BEAMS

Assignor

Exec Dt:

04/28/2010

Assignee

1900 WYATT DRIVE

SUITE 15

SANTA CLARA, CALIFORNIA 95054

Correspondence name and address
	C.A.ANDERSEN
	4105 DENHAM WAY
	PLANO, TX 75024

Search Results as of: 05/17/2024 10:36 AM

If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6

Web interface last modified: August 25, 2017 v.2.6