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Reel/Frame:024466/0521   Pages: 4
Recorded: 05/24/2010
Attorney Dkt #:10294.0006
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
04/12/2011
Application #:
11645616
Filing Dt:
12/27/2006
Publication #:
Pub Dt:
06/28/2007
Title:
TEMPERATURE MEASURING DEVICE AND METHOD FOR MEASURING WAFER-TYPE THERMOMETERS
Assignors
1
Exec Dt:
02/26/2007
2
Exec Dt:
02/26/2007
Assignee
1
3-6, AKASAKA 5-CHOME
MINATO-KU, TOKYO, JAPAN 107-8481
Correspondence name and address
DAVID W. HILL
FINNEGAN, HENDERSON, FARABOW ET AL.
901 NEW YORK AVENUE, N.W.
WASHINGTON, D.C. 20001-4413

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