Patent Assignment Details
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Reel/Frame: | 024533/0032 | |
| Pages: | 6 |
| | Recorded: | 06/14/2010 | | |
Attorney Dkt #: | 04329.4567 |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/26/2013
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Application #:
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12750396
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Filing Dt:
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03/30/2010
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Publication #:
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Pub Dt:
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02/24/2011
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Title:
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MASK DEFECT MEASUREMENT METHOD, MASK QUALITY DETERMINATION METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
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Assignees
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1-1, SHIBAURA 1-CHOME, MINATO-KU |
TOKYO, JAPAN 105-8001 |
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6-2, OTEMACHI 2-CHOME, CHIYODA-KU |
TOKYO, JAPAN 100-0004 |
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Correspondence name and address
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FINNEGAN
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901 NEW YORK AVENUE NW
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WASHINGTON DC, DC 20001
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