Patent Assignment Details
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| Reel/Frame: | 025021/0449 | |
| Pages: | 3 |
| | Recorded: | 09/21/2010 | | |
| Attorney Dkt #: | 101126 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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05/27/2014
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Application #:
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12873738
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Filing Dt:
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09/01/2010
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Publication #:
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Pub Dt:
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03/10/2011
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Title:
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SEMICONDUCTOR TESTING CIRCUIT, SEMICONDUCTOR TESTING JIG, SEMICONDUCTOR TESTING APPARATUS, AND SEMICONDUCTOR TESTING METHOD
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Assignees
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| 1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU |
| KAWASAKI-SHI, KANAGAWA, JAPAN 211-8588 |
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| 2-10-23, SHIN-YOKOHAMA, KOHOKU-KU, |
| YOKOHAMA-SHI, KANAGAWA, JAPAN 222-0033 |
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Correspondence name and address
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WESTERMAN, HATTORI, DANIELS & ADRIAN, LL
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1250 CONNECTICUT AVENUE, NW
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SUITE-700
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WASHINGTON, DC 20036-2657
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