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Reel/Frame:025928/0358   Pages: 6
Recorded: 03/09/2011
Attorney Dkt #:078023.0348 (10-013)
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
10/14/2014
Application #:
12895730
Filing Dt:
09/30/2010
Publication #:
Pub Dt:
04/05/2012
Title:
METHOD FOR MINIMIZING DEFECTS IN A SEMICONDUCTOR SUBSTRATE DUE TO ION IMPLANTATION
Assignors
1
Exec Dt:
02/25/2011
2
Exec Dt:
02/25/2011
3
Exec Dt:
02/25/2011
Assignee
1
NOMURA FUDOSAN SHIN-YOKOHAMA BUILDING
2-10-23 SHIM-YOKOHAMA, KOHOKU-KU
YOKOHAMA, KANAGAWA, JAPAN 222-033
Correspondence name and address
BAKER BOTTS LLP
2001 ROSS AVENUE
SUITE 600
DALLAS, TX 75201

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