Patent Assignment Details
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| Reel/Frame: | 026105/0980 | |
| Pages: | 4 |
| | Recorded: | 03/22/2011 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13065502
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Filing Dt:
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03/22/2011
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Publication #:
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Pub Dt:
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10/06/2011
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Title:
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Wavefront measurement method, wavefront measurement apparatus, and microscope
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Assignee
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| 43-2, HATAGAYA 2-CHOME, SHIBUYA-KU |
| TOKYO 151-0072, JAPAN |
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Correspondence name and address
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KENYON & KENYON LLP
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ONE BROADWAY
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NEW YORK NY 10004
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