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Reel/Frame:026371/0798   Pages: 2
Recorded: 06/01/2011
Attorney Dkt #:P10H0145/US
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
12/30/2014
Application #:
13150782
Filing Dt:
06/01/2011
Publication #:
Pub Dt:
06/21/2012
Title:
METHOD AND SYSTEM FOR TESTING SEMICONDUCTOR DEVICE
Assignors
1
Exec Dt:
04/22/2011
2
Exec Dt:
04/22/2011
Assignee
1
SAN 136-1, AMI-RI, BUBAL-EUP, ICHEON-SI
GYEONGGI-DO, KOREA, REPUBLIC OF 467-701
Correspondence name and address
IP & T GROUP LLP
7700 LITTLE RIVER TURNPIKE
SUITE 207
ANNANDALE, VA 22003

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