Patent Assignment Details
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| Reel/Frame: | 026907/0176 | |
| Pages: | 3 |
| | Recorded: | 09/14/2011 | | |
| Attorney Dkt #: | 110180 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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06/03/2014
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Application #:
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13203095
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Filing Dt:
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08/24/2011
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Publication #:
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Pub Dt:
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12/15/2011
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Title:
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METHOD AND APPARATUS OF PRECISELY MEASURING INTENSITY PROFILE OF X-RAY NANOBEAM
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Assignees
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| 5-2, MINATOJIMAMINAMIMACHI 5-CHOME, CHUO-KU, |
| KOBE-SHI, HYOGO, JAPAN 650-0047 |
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| 1-1, YAMADAOKA, |
| SUITA-SHI, OSAKA, JAPAN 565-0871 |
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Correspondence name and address
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KRATZ, QUINTOS & HANSON, LLP
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4TH FLOOR
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1420 K STREET, N.W.
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WASHINGTON, DC 20005
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