Patent Assignment Details
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| Reel/Frame: | 027092/0631 | |
| Pages: | 3 |
| | Recorded: | 10/20/2011 | | |
| Attorney Dkt #: | TTCIP293US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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13177127
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Filing Dt:
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07/06/2011
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Publication #:
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Pub Dt:
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02/02/2012
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Title:
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DEFECT ANALYSIS METHOD OF SEMICONDUCTOR DEVICE
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Assignee
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| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN 105-8001 |
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Correspondence name and address
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TUROCY & WATSON, LLP
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127 PUBLIC SQUARE
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57TH FLOOR, KEY TOWER
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CLEVELAND, OH 44114
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