Patent Assignment Details
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| Reel/Frame: | 027278/0380 | |
| Pages: | 12 |
| | Recorded: | 11/22/2011 | | |
| Attorney Dkt #: | P40574 |
| Conveyance: | CORRECTIVE ASSIGNMENT TO CORRECT THE OMISSION OF SECOND ASSIGNEE PREVIOUSLY RECORDED ON REEL 027018 FRAME 0056. ASSIGNOR(S) HEREBY CONFIRMS THE TO ADD SECOND ASSIGNEE SHINKO ELECTRIC INDUSTRIES CO.,LTD., 80, OSHIMADA-MACHI, NAGANO-SHI, NAGANO 381-2287, JAPAN. |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/30/2014
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Application #:
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13212585
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Filing Dt:
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08/18/2011
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Publication #:
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Pub Dt:
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03/01/2012
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Title:
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TEST-USE INDIVIDUAL SUBSTRATE, PROBE, AND SEMICONDUCTOR WAFER TESTING APPARATUS
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Assignees
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| 32-1 ASAHICHO, NERIMA-KU |
| TOKYO, JAPAN 179-0071 |
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| 80, OSHIMADA-MACHI, NAGANO-SHI |
| NAGANO, JAPAN 381-2287 |
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Correspondence name and address
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GREENBLUM & BERNSTEIN
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1950 ROLAND CLARKE PLACE
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RESTON, VA 20191
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