Patent Assignment Details
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| Reel/Frame: | 027575/0903 | |
| Pages: | 2 |
| | Recorded: | 01/23/2012 | | |
| Attorney Dkt #: | 213/359 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/27/2013
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Application #:
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13291800
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Filing Dt:
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11/08/2011
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Publication #:
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Pub Dt:
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05/09/2013
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Title:
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SYSTEM AND METHOD FOR IN SITU MONITORING OF TOP WAFER THICKNESS IN A STACK OF WAFERS
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Assignee
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| 825 BUCKLEY ROAD |
| SAN LUIS OBISPO, CALIFORNIA 93401 |
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Correspondence name and address
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CROCKETT & CROCKETT, P.C.
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26020 ACERO
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SUITE 200
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MISSION VIEJO, CA 92691
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