Patent Assignment Details
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| Reel/Frame: | 027821/0808 | |
| Pages: | 2 |
| | Recorded: | 03/07/2012 | | |
| Attorney Dkt #: | 1625-233 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/12/2013
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Application #:
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13394705
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Filing Dt:
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03/07/2012
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Publication #:
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Pub Dt:
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07/05/2012
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Title:
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METHOD FOR QUANTITATIVELY EVALUATING CONCENTRATION OF ATOMIC VACANCIES EXISTING IN SILICON WAFER, METHOD FOR MANUFACTURING SILICON WAFER, AND SILICON WAFER MANUFACTURED BY THE METHOD FOR MANUFACTURING SILICON WAFER
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Assignee
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| 8050 IKARASHI NI-NOCHO, NISHI-KU, NIIGATA-SHI |
| NIIGATA, JAPAN 9502181 |
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Correspondence name and address
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AMY A. DOBBELAERE NOVAK DRUCE & QUIGG LL
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525 OKEECHOBEE BLVD
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SUITE 1500
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WEST PALM BEACH, FL 33401
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