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Reel/Frame:028108/0268   Pages: 7
Recorded: 04/26/2012
Attorney Dkt #:2DCS-025-PCT-US
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
12/08/2015
Application #:
13145109
Filing Dt:
01/05/2012
Publication #:
Pub Dt:
11/29/2012
Title:
METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR WAFER
Assignor
1
Exec Dt:
09/27/2011
Assignee
1
13-11 OMORI-KITA 2-CHOME, OTA-KU
TOKYO, JAPAN 143-8580
Correspondence name and address
ALKIMIE C/O SCHWEIGER& PARTNER (SG) LLP
105 CECIL STREET
#03-02, THE OCTAGON
SINGAPORE, 069534 SINGAPORE

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