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Patent Assignment Details

NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:	029583/0982			Pages:	16
		Recorded:	12/20/2012
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 30

Patent #:	6252981	Issue Dt:	06/26/2001	Application #:	09270607	Filing Dt:	03/17/1999
Title:	SYSTEM AND METHOD FOR SELECTION OF A REFERENCE DIE

Patent #:	6324298	Issue Dt:	11/27/2001	Application #:	09352564	Filing Dt:	07/13/1999
Title:	AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMING SUCH INSPECTION

Patent #:	6744913	Issue Dt:	06/01/2004	Application #:	09551106	Filing Dt:	04/18/2000
Title:	SYSTEM AND METHOD FOR LOCATING IMAGE FEATURES

Patent #:	6937753	Issue Dt:	08/30/2005	Application #:	09561570	Filing Dt:	04/29/2000
Title:	AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMING SUCH INSPECTION

Patent #:	6826298	Issue Dt:	11/30/2004	Application #:	09562273	Filing Dt:	04/29/2000
Title:	AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMING SUCH INSPECTION

Patent #:	6459807	Issue Dt:	10/01/2002	Application #:	09592641	Filing Dt:	06/13/2000
Title:	SYSTEM AND METHOD FOR LOCATING IRREGULAR EDGES IN IMAGE DATA

Patent #:	6765666	Issue Dt:	07/20/2004	Application #:	09631509	Filing Dt:	08/03/2000
Title:	SYSTEM AND METHOD FOR INSPECTING BUMPED WAFERS

Patent #:	6731383	Issue Dt:	05/04/2004	Application #:	09952537	Filing Dt:	09/12/2001
Publication #:	US20020191178	Pub Dt:	12/19/2002
Title:	CONFOCAL 3D INSPECTION SYSTEM AND PROCESS

Patent #:	6643006	Issue Dt:	11/04/2003	Application #:	10016996	Filing Dt:	12/13/2001
Title:	METHOD AND SYSTEM FOR REVIEWING A SEMICONDUCTOR WAFER USING AT LEAST ONE DEFECT SAMPLING CONDITION

Patent #:	7024031	Issue Dt:	04/04/2006	Application #:	10035592	Filing Dt:	10/23/2001
Title:	SYSTEM AND METHOD FOR INSPECTION USING OFF-ANGLE LIGHTING

Patent #:	6970287	Issue Dt:	11/29/2005	Application #:	10196735	Filing Dt:	07/16/2002
Title:	CONFOCAL 3D INSPECTION SYSTEM AND PROCESS

Patent #:	6773935	Issue Dt:	08/10/2004	Application #:	10196741	Filing Dt:	07/16/2002
Publication #:	US20030027367	Pub Dt:	02/06/2003
Title:	CONFOCAL 3D INSPECTION SYSTEM AND PROCESS

Patent #:	7046837	Issue Dt:	05/16/2006	Application #:	10224919	Filing Dt:	08/21/2002
Publication #:	US20020191832	Pub Dt:	12/19/2002
Title:	SYSTEM AND METHOD FOR LOCATING IRREGULAR EDGES IN IMAGE DATA

Patent #:	7629993	Issue Dt:	12/08/2009	Application #:	10262173	Filing Dt:	09/30/2002
Publication #:	US20040061779	Pub Dt:	04/01/2004
Title:	AUTOMATED WAFER DEFECT INSPECTION SYSTEM USING BACKSIDE ILLUMINATION

Patent #:	6842866	Issue Dt:	01/11/2005	Application #:	10281398	Filing Dt:	10/25/2002
Publication #:	US20040083407	Pub Dt:	04/29/2004
Title:	METHOD AND SYSTEM FOR ANALYZING BITMAP TEST DATA

Patent #:	7111095	Issue Dt:	09/19/2006	Application #:	10423475	Filing Dt:	04/25/2003
Publication #:	US20030221042	Pub Dt:	11/27/2003
Title:	Data transfer device with data frame grabber with switched fabric interface wherein data is distributed across network over virtual lane

Patent #:	7158235	Issue Dt:	01/02/2007	Application #:	10467438	Filing Dt:	12/08/2003
Publication #:	US20040090634	Pub Dt:	05/13/2004
Title:	SYSTEM AND METHOD FOR INSPECTION USING WHITE LIGHT INTEREROMETRY

Patent #:	7192173	Issue Dt:	03/20/2007	Application #:	10622847	Filing Dt:	07/18/2003
Publication #:	US20040057135	Pub Dt:	03/25/2004
Title:	OPTICAL THROUGHPUT CONDENSER

Patent #:	7170075	Issue Dt:	01/30/2007	Application #:	10622848	Filing Dt:	07/18/2003
Publication #:	US20040056173	Pub Dt:	03/25/2004
Title:	INSPECTION TOOL WITH A 3D POINT SENSOR TO DEVELOP A FOCUS MAP

Patent #:	7019841	Issue Dt:	03/28/2006	Application #:	10742254	Filing Dt:	12/19/2003
Publication #:	US20040227953	Pub Dt:	11/18/2004
Title:	SYSTEM AND METHOD FOR INSPECTING A COMPONENT USING INTERFEROMETRY

Patent #:	7220034	Issue Dt:	05/22/2007	Application #:	10888302	Filing Dt:	07/09/2004
Publication #:	US20050007792	Pub Dt:	01/13/2005
Title:	FIBER OPTIC DARKFIELD RING LIGHT

Patent #:	8045788	Issue Dt:	10/25/2011	Application #:	10890734	Filing Dt:	07/14/2004
Publication #:	US20050041850	Pub Dt:	02/24/2005
Title:	PRODUCT SETUP SHARING FOR MULTIPLE INSPECTION SYSTEMS

Patent #:	7589783	Issue Dt:	09/15/2009	Application #:	10890862	Filing Dt:	07/14/2004
Publication #:	US20050052530	Pub Dt:	03/10/2005
Title:	CAMERA AND ILLUMINATION MATCHING FOR INSPECTION SYSTEM

Patent #:	7197178	Issue Dt:	03/27/2007	Application #:	10890933	Filing Dt:	07/14/2004
Publication #:	US20050013476	Pub Dt:	01/20/2005
Title:	PHOTORESIST EDGE BEAD REMOVAL MEASUREMENT

Patent #:	7316938	Issue Dt:	01/08/2008	Application #:	10891278	Filing Dt:	07/14/2004
Publication #:	US20050012229	Pub Dt:	01/20/2005
Title:	ADJUSTABLE FILM FRAME ALIGNER

Patent #:	7813638	Issue Dt:	10/12/2010	Application #:	11146301	Filing Dt:	06/06/2005
Publication #:	US20050276595	Pub Dt:	12/15/2005
Title:	SYSTEM FOR GENERATING CAMERA TRIGGERS

Patent #:	7593565	Issue Dt:	09/22/2009	Application #:	11296645	Filing Dt:	12/07/2005
Publication #:	US20060142971	Pub Dt:	06/29/2006
Title:	ALL SURFACE DATA FOR USE IN SUBSTRATE INSPECTION

Patent #:	NONE	Issue Dt:		Application #:	13273645	Filing Dt:	10/14/2011
Publication #:	US20120087569	Pub Dt:	04/12/2012
Title:	AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMING SUCH INSPECTION

Assignor

Exec Dt:

12/19/2012

Assignee

ONE RUDOLPH ROAD

FLANDERS, NEW JERSEY 07836

Correspondence name and address
	DICKE, BILLIG & CZAJA, PLLC
	SUITE 2250
	100 SOUTH FIFTH STREET
	MINNEAPOLIS, MINNESOTA 55402

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