Patent Assignment Details
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| Reel/Frame: | 029880/0474 | |
| Pages: | 5 |
| | Recorded: | 02/26/2013 | | |
| Attorney Dkt #: | SANK-0029 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/10/2015
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Application #:
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13819288
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Filing Dt:
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02/26/2013
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Publication #:
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Pub Dt:
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06/20/2013
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Title:
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CRYSTALLINE QUALITY EVALUATION APPARATUS FOR THIN-FILM SEMICONDUCTORS, USING µ-PCD TECHNIQUt
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Assignees
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| 10-26, WAKINOHAMA-CHO 2-CHOME, CHUO-KU |
| KOBE-SHI, HYOGO, JAPAN 651-8585 |
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| 5-1, WAKINOHAMA-KAIGAN-DORI 1-CHOME, CHUO-KU |
| KOBE-SHI, HYOGO, JAPAN 651-0073 |
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Correspondence name and address
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JUAN CARLOS A. MARQUEZ C/O STITES & HARB
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1199 NORTH FAIRFAX STREET, SUITE 900
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ALEXANDRIA, VA 22314
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