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Reel/Frame:030053/0359   Pages: 4
Recorded: 03/20/2013
Attorney Dkt #:13139
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
NONE
Issue Dt:
Application #:
13780641
Filing Dt:
02/28/2013
Publication #:
Pub Dt:
09/19/2013
Title:
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, METHOD OF FABRICATING SEMICONDUCTOR DEVICE, AND INSPECTION TOOL
Assignors
1
Exec Dt:
02/26/2013
2
Exec Dt:
02/26/2013
3
Exec Dt:
03/08/2013
Assignee
1
1-1, SHIBAURA 1-CHOME
MINATO-KU
TOKYO, JAPAN
Correspondence name and address
HOLTZ, HOLTZ, GOODMAN & CHICK PC
220 FIFTH AVENUE
16TH FLOOR
NEW YORK, NY 10001

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