Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 031001/0193 | |
| Pages: | 10 |
| | Recorded: | 08/13/2013 | | |
| Attorney Dkt #: | TAMAR |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
6
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Patent #:
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Issue Dt:
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03/23/2004
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Application #:
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10382669
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Filing Dt:
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03/05/2003
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Title:
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CONCENTRICITY MEASURING INSTRUMENT FOR A FIBEROPTIC CABLE END
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Patent #:
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Issue Dt:
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01/13/2009
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Application #:
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11261284
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Filing Dt:
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10/28/2005
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Publication #:
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Pub Dt:
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05/25/2006
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Title:
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TRENCH MEASUREMENT SYSTEM EMPLOYING A CHROMATIC CONFOCAL HEIGHT SENSOR AND A MICROSCOPE
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Patent #:
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Issue Dt:
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06/15/2010
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Application #:
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11978881
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Filing Dt:
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10/29/2007
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Title:
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WAFER MEASUREMENT SYSTEM AND APPARATUS
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Patent #:
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NONE
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Issue Dt:
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Application #:
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12456781
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Filing Dt:
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06/23/2009
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Publication #:
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Pub Dt:
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12/23/2010
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Title:
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System for directly measuring the depth of a high aspect ratio etched feature on a wafer
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Patent #:
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Issue Dt:
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07/25/2017
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Application #:
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13066219
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Filing Dt:
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04/08/2011
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Publication #:
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Pub Dt:
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10/11/2012
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Title:
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Wafer shape thickness and trench measurement
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Patent #:
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Issue Dt:
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02/11/2014
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Application #:
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13134716
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Filing Dt:
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06/15/2011
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Publication #:
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Pub Dt:
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12/01/2011
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Title:
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SYSTEM FOR DIRECTLY MEASURING THE DEPTH OF A HIGH ASPECT RATIO ETCHED FEATURE ON A WAFER
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Assignee
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| ONE RUDOLPH ROAD |
| FLANDERS, NEW JERSEY 07836 |
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Correspondence name and address
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TODD R. FRONEK
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DICKE, BILLIG & CZAJA, PLLC
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100 SOUTH FIFTH STREET, SUITE 2250
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MINNEAPOLIS, MN 55402
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