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Total properties:
18
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Patent #:
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Issue Dt:
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09/25/2001
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Application #:
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09432928
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Filing Dt:
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11/03/1999
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Title:
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METHOD OF DETERMINING PERFORMANCE CHARACTERISTICS OF POLISHING PADS
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Patent #:
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Issue Dt:
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07/29/2003
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Application #:
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09607391
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Filing Dt:
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06/30/2000
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Title:
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METHOD AND APPARATUS FOR FORMING A SILICON WAFER WITH A DENUDED ZONE
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Patent #:
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Issue Dt:
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12/18/2001
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Application #:
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09677909
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Filing Dt:
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10/03/2000
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Title:
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Radio frequency identification system and method for tracking silicon wafers
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Patent #:
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Issue Dt:
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03/30/2004
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Application #:
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09682677
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Filing Dt:
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10/04/2001
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Publication #:
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Pub Dt:
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04/10/2003
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Title:
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POLISHING APPARATUS, POLISHING HEAD AND METHOD
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Patent #:
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Issue Dt:
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02/18/2003
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Application #:
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09807907
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Filing Dt:
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06/08/2001
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Title:
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CARRIER FOR CLEANING SILICON WAFERS
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Patent #:
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Issue Dt:
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11/25/2003
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Application #:
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09943600
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Filing Dt:
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08/30/2001
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Publication #:
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Pub Dt:
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02/21/2002
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Title:
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PROCESS FOR PREPARING A SILICON MELT
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Patent #:
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Issue Dt:
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02/22/2005
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Application #:
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09972608
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Filing Dt:
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10/05/2001
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Publication #:
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Pub Dt:
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05/16/2002
| | | | |
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Title:
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METHOD FOR THE PRODUCTION OF LOW DEFECT DENSITY SILICON
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Patent #:
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Issue Dt:
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03/07/2006
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Application #:
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10022967
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Filing Dt:
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12/13/2001
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Publication #:
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Pub Dt:
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07/04/2002
| | | | |
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Title:
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PROCESS FOR RECLAIMING SEMICONDUCTOR WAFERS AND RECLAIMED WAFERS
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Patent #:
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Issue Dt:
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02/01/2005
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Application #:
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10038084
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Filing Dt:
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01/03/2002
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Publication #:
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Pub Dt:
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08/22/2002
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Title:
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SOI structure having a device layer which is vacancy dominated and substantially free fo agglomerated vacancy type defects
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Patent #:
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Issue Dt:
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01/25/2005
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Application #:
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10054629
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Filing Dt:
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01/22/2002
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Publication #:
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Pub Dt:
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08/01/2002
| | | | |
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Title:
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LOW DEFECT DENSITY SILICON HAVING A VACANCY-DOMINATED CORE SUBSTANTIALLY FREE OF OXIDATION INDUCED STACKING FAULTS
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Patent #:
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Issue Dt:
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02/03/2004
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Application #:
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10067070
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Filing Dt:
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02/04/2002
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Publication #:
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Pub Dt:
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11/21/2002
| | | | |
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Title:
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PROCESS FOR PRODUCING THERMALLY ANNEALED WAFERS HAVING IMPROVED INTERNAL GETTERING
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Patent #:
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Issue Dt:
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06/01/2004
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Application #:
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10073506
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Filing Dt:
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02/11/2002
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Publication #:
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Pub Dt:
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07/04/2002
| | | | |
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Title:
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THERMAL ANNEALING PROCESS FOR PRODUCING LOW DEFECT DENSITY SINGLE CRYSTAL SILICON
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Patent #:
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Issue Dt:
|
06/01/2004
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Application #:
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10113378
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Filing Dt:
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03/29/2002
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Publication #:
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Pub Dt:
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11/28/2002
| | | | |
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Title:
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THERMAL ANNEALING PROCESS FOR PRODUCING SILICON WAFERS WITH IMPROVED SURFACE CHARACTERISTICS
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|
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Patent #:
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Issue Dt:
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10/14/2003
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Application #:
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10135597
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Filing Dt:
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04/30/2002
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Publication #:
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Pub Dt:
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11/21/2002
| | | | |
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Title:
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LOW DEFECT DENSITY EPITAXIAL WAFER AND A PROCESS FOR THE PREPARATION THEREOF
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Patent #:
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Issue Dt:
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08/16/2005
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Application #:
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10177444
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Filing Dt:
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06/21/2002
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Publication #:
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Pub Dt:
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01/09/2003
| | | | |
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Title:
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SILICON ON INSULATOR STRUTURE HAVING AN EPITAXIAL LAYER AND INTRINSIC GETTERING
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Patent #:
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Issue Dt:
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03/22/2005
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Application #:
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10204654
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Filing Dt:
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11/04/2002
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Publication #:
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Pub Dt:
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11/13/2003
| | | | |
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Title:
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CONTROLLED NECK GROWTH PROCESS FOR SINGLE CRYSTAL SILICON
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Patent #:
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Issue Dt:
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11/25/2003
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Application #:
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10229415
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Filing Dt:
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08/28/2002
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Publication #:
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Pub Dt:
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03/06/2003
| | | | |
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Title:
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MODIFIED SUSCEPTOR FOR USE IN CHEMICAL VAPOR DEPOSITION PROCESS
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Patent #:
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|
Issue Dt:
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10/26/2004
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Application #:
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10328481
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Filing Dt:
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12/23/2002
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Publication #:
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Pub Dt:
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07/24/2003
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Title:
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IDEAL OXYGEN PRECIPITATING SILICON WAFERS WITH NITROGEN/CARBON STABILIZED OXYGEN PRECIPITATE NUCLEATION CENTERS AND PROCESS FOR MAKING THE SAME
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