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Patent Assignment Details
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Reel/Frame:033122/0154   Pages: 8
Recorded: 06/17/2014
Attorney Dkt #:3521.52
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 11
1
Patent #:
Issue Dt:
02/17/1998
Application #:
08720852
Filing Dt:
10/02/1996
Title:
METALLIZATION COMPOSITE HAVING NICKEL INTERMEDIATE/INTERFACE
2
Patent #:
Issue Dt:
10/19/2004
Application #:
09526394
Filing Dt:
03/16/2000
Publication #:
Pub Dt:
05/16/2002
Title:
COPPER PAD STRUCTURE
3
Patent #:
Issue Dt:
08/03/2004
Application #:
10371466
Filing Dt:
02/21/2003
Publication #:
Pub Dt:
11/27/2003
Title:
SELECTIVE FILLING OF ELECTRICALLY CONDUCTIVE VIAS FOR THREE DIMENSIONAL DEVICE STRUCTURES
4
Patent #:
Issue Dt:
11/16/2004
Application #:
10605752
Filing Dt:
10/23/2003
Publication #:
Pub Dt:
11/25/2004
Title:
IMPROVEMENTS IN GROUNDING AND THERMAL DISSIPATION FOR INTEGRATED CIRCUIT PACKAGES
5
Patent #:
Issue Dt:
04/22/2008
Application #:
10904677
Filing Dt:
11/23/2004
Publication #:
Pub Dt:
05/25/2006
Title:
HIGH SURFACE AREA ALUMINUM BOND PAD FOR THROUGH-WAFER CONNECTIONS TO AN ELECTRONIC PACKAGE
6
Patent #:
Issue Dt:
02/03/2009
Application #:
11673618
Filing Dt:
02/12/2007
Publication #:
Pub Dt:
08/14/2008
Title:
UNDERCUT-FREE BLM PROCESS FOR PB-FREE AND PB-REDUCED C4
7
Patent #:
Issue Dt:
11/02/2010
Application #:
12357484
Filing Dt:
01/22/2009
Publication #:
Pub Dt:
05/21/2009
Title:
UNDERCUT-FREE BLM PROCESS FOR PB-FREE AND PB-REDUCED C4
8
Patent #:
Issue Dt:
06/12/2012
Application #:
12458441
Filing Dt:
07/13/2009
Publication #:
Pub Dt:
01/13/2011
Title:
STRUCTURES AND METHODS TO IMPROVE LEAD-FREE C4 INTERCONNECT RELIABILITY
9
Patent #:
Issue Dt:
11/06/2012
Application #:
12642479
Filing Dt:
12/18/2009
Publication #:
Pub Dt:
06/23/2011
Title:
OVERCOMING LAMINATE WARPAGE AND MISALIGNMENT IN FLIP-CHIP PACKAGES
10
Patent #:
Issue Dt:
12/20/2011
Application #:
12719153
Filing Dt:
03/08/2010
Publication #:
Pub Dt:
07/01/2010
Title:
LOCALIZED TEMPERATURE CONTROL DURING RAPID THERMAL ANNEAL
11
Patent #:
Issue Dt:
09/20/2011
Application #:
12911940
Filing Dt:
10/26/2010
Title:
SEMICONDUCTOR WAFER PROCESSING METHOD THAT ALLOWS DEVICE REGIONS TO BE SELECTIVELY ANNEALED FOLLOWING BACK END OF THE LINE (BEOL) METAL WIRING LAYER FORMATION
Assignor
1
Exec Dt:
08/05/2013
Assignee
1
3050 ZANKER ROAD
SAN JOSE, CALIFORNIA 95134
Correspondence name and address
ALLSTON L. JONES
425 SHERMAN AVENUE, SUITE 230
PALO ALTO, CA 94306

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