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Total properties:
91
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Patent #:
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Issue Dt:
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03/02/1999
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08600141
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Filing Dt:
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02/12/1996
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Title:
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ANALYZING METHOD AND APPARATUS FOR MINUTE FOREIGN SUBSTANCES, AND MANUFACTURING METHODS FOR MANUFACTURING SEMICONDUCTOR DEVICE AND LIQUID CRYSTAL DISPLAY DEVICE USING THE SAME
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09/26/2000
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08600142
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Filing Dt:
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02/12/1996
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Title:
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Patent #:
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Issue Dt:
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10/27/1998
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Application #:
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08678045
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Filing Dt:
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07/10/1996
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Title:
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02/17/1998
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08688497
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Filing Dt:
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07/30/1996
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Title:
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SAMPLE CONTAINER SEALER HAVING FUNCTION OF SETTING LOAD
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02/29/2000
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08724996
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Filing Dt:
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10/03/1996
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Title:
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Patent #:
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Issue Dt:
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05/02/2000
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Application #:
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08896664
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Filing Dt:
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07/18/1997
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Title:
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THERMOGRAVIMETRIC INSTRUMENT
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Issue Dt:
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09/12/2000
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08922892
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Filing Dt:
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09/03/1997
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Title:
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Patent #:
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Issue Dt:
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10/19/1999
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Application #:
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08923562
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Filing Dt:
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09/04/1997
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Title:
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Patent #:
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Issue Dt:
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11/28/2000
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Application #:
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09064332
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Filing Dt:
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04/22/1998
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Title:
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Patent #:
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Issue Dt:
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07/03/2001
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09187938
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Filing Dt:
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11/06/1998
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Title:
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ANALYZING METHOD AND APPARATUS FOR MINUTE FOREIGN SUBSTANCES, AND MANUFACTURING METHODS FOR MANUFACTURING SEMICONDUCTOR DEVICE AND LIQUID CRYSTAL DISPLAY DEVICE USING THE SAME
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Patent #:
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Issue Dt:
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03/04/2003
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Application #:
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09356234
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Filing Dt:
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07/16/1999
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Title:
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THIN PIECE FORMING METHOD
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Patent #:
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Issue Dt:
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08/20/2002
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Application #:
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09360338
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Filing Dt:
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07/26/1999
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Title:
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Patent #:
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Issue Dt:
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07/29/2003
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09517673
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Filing Dt:
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03/02/2000
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Title:
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Patent #:
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06/29/2004
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10032295
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12/21/2001
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08/15/2002
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Title:
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ELECTRIC DISCHARGE DETECTION CIRCUIT
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Patent #:
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Issue Dt:
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09/16/2003
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10171797
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06/13/2002
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Publication #:
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Pub Dt:
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01/09/2003
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Title:
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Patent #:
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Issue Dt:
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05/03/2005
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10436896
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Filing Dt:
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05/13/2003
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Publication #:
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Pub Dt:
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01/22/2004
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Title:
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Patent #:
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Issue Dt:
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07/29/2008
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11182108
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Filing Dt:
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07/15/2005
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Publication #:
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Pub Dt:
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01/19/2006
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Title:
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PROBE AND SMALL SAMPLE PICK UP MECHANISM
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Patent #:
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Issue Dt:
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03/13/2007
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Application #:
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11195982
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Filing Dt:
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08/02/2005
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Publication #:
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Pub Dt:
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02/23/2006
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Title:
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METHOD OF CORRECTING AMPLITUDE DEFECT IN MULTILAYER FILM OF EUVL MASK
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Patent #:
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Issue Dt:
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10/30/2007
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11264403
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Filing Dt:
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11/01/2005
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Publication #:
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Pub Dt:
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05/04/2006
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Title:
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Patent #:
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Issue Dt:
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12/02/2008
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Application #:
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11286684
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Filing Dt:
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11/23/2005
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Publication #:
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Pub Dt:
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06/08/2006
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Title:
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METHOD OF DETERMINING PROCESSING POSITION IN CHARGED PARTICLE BEAM APPARATUS, AND INFRARED MICROSCOPE USED IN THE METHOD
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Patent #:
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Issue Dt:
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08/18/2009
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11542434
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Filing Dt:
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10/03/2006
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Publication #:
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Pub Dt:
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07/12/2007
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Title:
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Patent #:
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Issue Dt:
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02/03/2009
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Application #:
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11586190
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Filing Dt:
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10/25/2006
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Publication #:
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Pub Dt:
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05/24/2007
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Title:
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CHARGED PARTICLE BEAM SCAN AND IRRADIATION METHOD, CHARGED PARTICLE BEAM APPARATUS, WORKPIECE OBSERVATION METHOD AND WORKPIECE PROCESSING METHOD
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Patent #:
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Issue Dt:
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11/25/2008
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Application #:
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11657271
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Filing Dt:
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01/24/2007
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Publication #:
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Pub Dt:
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08/16/2007
| | | | |
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Title:
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DIFFERENTIAL SCANNING CALORIMETER
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Patent #:
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Issue Dt:
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08/18/2009
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Application #:
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11701286
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Filing Dt:
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01/31/2007
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Publication #:
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Pub Dt:
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09/18/2008
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Title:
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SAMPLE HOLDING MECHANISM AND SAMPLE WORKING/OBSERVING APPARATUS
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Patent #:
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Issue Dt:
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12/01/2009
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11703292
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02/07/2007
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Publication #:
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Pub Dt:
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03/27/2008
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Title:
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FOCUSED ION BEAM APPARATUS AND METHOD OF PREPARING/OBSERVING SAMPLE
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Patent #:
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06/16/2009
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Application #:
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11706823
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Filing Dt:
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02/13/2007
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Publication #:
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Pub Dt:
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10/18/2007
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Title:
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FREEZING POINT TEMPERATURE MEASURING METHOD AND TEMPERATURE CALIBRATING METHOD IN DIFFERENTIAL SCANNING CALORIMETRY
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12/15/2009
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11708789
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02/20/2007
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Pub Dt:
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09/13/2007
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Title:
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FLUORESCENT X-RAY ANALYSIS APPARATUS
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Patent #:
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08/11/2009
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11712011
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02/28/2007
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Publication #:
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Pub Dt:
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03/27/2008
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Title:
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WAFER HOLDER AND SAMPLE PRODUCING APPARATUS USING IT
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09/23/2008
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11729247
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03/28/2007
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Publication #:
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Pub Dt:
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01/17/2008
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Title:
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FLUORESCENT X-RAY ANALYSIS APPARATUS
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Patent #:
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08/11/2009
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11796996
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04/27/2007
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Publication #:
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Pub Dt:
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12/06/2007
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Title:
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METHOD OF CORRECTING OPAQUE DEFECT OF PHOTOMASK USING ATOMIC FORCE MICROSCOPE FINE PROCESSING DEVICE
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01/05/2010
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11796997
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04/27/2007
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Publication #:
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Pub Dt:
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11/15/2007
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Title:
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SEMICONDUCTOR MASK CORRECTING DEVICE AND SEMICONDUCTOR MASK CORRECTING METHOD
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10/14/2008
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11799992
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05/02/2007
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11/22/2007
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Title:
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FLUORESCENT X-RAY ANALYSIS APPARATUS
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12/30/2008
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11805664
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05/24/2007
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12/06/2007
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Title:
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FLUORESCENT X-RAY ANALYSIS APPARATUS
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09/09/2008
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11805665
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05/24/2007
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11/29/2007
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Title:
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FLUORESCENT X-RAY ANALYSIS APPARATUS
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08/24/2010
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11809623
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06/01/2007
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01/03/2008
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THERMAL ANALYZER
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11/22/2011
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11810230
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06/04/2007
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06/05/2008
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MICRO-MACHINING DUST REMOVING DEVICE, MICRO-MACHINING APPARATUS, AND MICRO-MACHINING DUST REMOVING METHOD
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05/05/2009
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11820893
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06/21/2007
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01/10/2008
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Title:
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ENERGY DISPERSION TYPE RADIATION DETECTING SYSTEM AND METHOD OF MEASURING CONTENT OF OBJECT ELEMENT
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04/14/2009
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11824994
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07/02/2007
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Pub Dt:
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03/20/2008
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Title:
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METHOD AND APPARATUS OF MEASURING THIN FILM SAMPLE AND METHOD AND APPARATUS OF FABRICATING THIN FILM SAMPLE
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09/15/2009
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11835036
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08/07/2007
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02/28/2008
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Title:
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SCANNING TYPE PROBE MICROSCOPE
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08/31/2010
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11840549
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08/17/2007
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Pub Dt:
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02/28/2008
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Title:
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OPTICAL DISPLACEMENT-DETECTING MECHANISM AND PROBE MICROSCOPE USING THE SAME
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05/12/2009
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11840575
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08/17/2007
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02/21/2008
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Title:
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06/29/2010
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11841400
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08/20/2007
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11/13/2008
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Title:
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THERMAL ANALYSIS APPARATUS
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07/05/2011
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11841445
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08/20/2007
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02/28/2008
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Title:
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OPTICAL DISPLACEMENT DETECTION MECHANISM AND SURFACE INFORMATION MEASUREMENT DEVICE USING THE SAME
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11/10/2009
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11842722
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08/21/2007
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02/28/2008
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Title:
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11/10/2009
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11842735
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08/21/2007
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03/13/2008
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Title:
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SCANNING PROBE MICROSCOPE FINE-MOVEMENT MECHANISM AND SCANNING PROBE MICROSCOPE USING SAME
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03/24/2009
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11845540
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08/27/2007
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03/06/2008
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X-RAY ANALYSIS APPARATUS
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12/03/2013
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11849705
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09/04/2007
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02/07/2008
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01/05/2010
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07/18/2007
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01/31/2008
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THERMAL ANALYSIS SYSTEM AND METHOD OF DRYING THE SAME
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08/10/2010
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10/30/2007
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05/08/2008
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SAMPLE OPERATION APPARATUS
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01/11/2011
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10/31/2007
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05/08/2008
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SAMPLE OPERATION APPARATUS
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05/20/2014
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11/07/2007
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11/27/2008
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05/31/2011
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12/19/2007
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07/03/2008
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01/18/2011
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12/20/2007
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07/03/2008
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09/28/2010
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12/20/2007
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06/26/2008
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DIFFERENTIAL SCANNING CALORIMETER
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09/08/2009
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11972337
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01/10/2008
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09/04/2008
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X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
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03/16/2010
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11972352
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01/10/2008
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07/31/2008
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09/15/2009
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12031283
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Filing Dt:
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02/14/2008
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Publication #:
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Pub Dt:
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08/07/2008
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Title:
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HEAT FLOW FLUX TYPE DIFFERENTIAL SCANNING CALORIMETER
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Patent #:
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Issue Dt:
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07/13/2010
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Application #:
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12046987
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Filing Dt:
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03/12/2008
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Publication #:
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Pub Dt:
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12/18/2008
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Title:
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FOCUSED ION BEAM APPARATUS
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Patent #:
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Issue Dt:
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07/13/2010
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Application #:
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12047013
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Filing Dt:
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03/12/2008
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Publication #:
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Pub Dt:
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09/18/2008
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Title:
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APPARATUS FOR WORKING AND OBSERVING SAMPLES AND METHOD OF WORKING AND OBSERVING CROSS SECTIONS
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Patent #:
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Issue Dt:
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01/18/2011
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Application #:
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12047022
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Filing Dt:
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03/12/2008
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Publication #:
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Pub Dt:
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12/11/2008
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Title:
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SAMPLE RELOCATION METHOD IN CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTICLE BEAM APPARATUS AS WELL AS SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPE
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Patent #:
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Issue Dt:
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04/19/2011
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Application #:
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12129149
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Filing Dt:
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05/29/2008
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Publication #:
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Pub Dt:
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12/25/2008
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Title:
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SAMPLE MANIPULATING APPARATUS
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Patent #:
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Issue Dt:
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08/23/2011
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Application #:
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12129350
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Filing Dt:
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05/29/2008
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Publication #:
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Pub Dt:
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12/04/2008
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Title:
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POSITIONING APPARATUS AND SCANNING PROBE MICROSCOPE EMPLOYING THE SAME
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Patent #:
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Issue Dt:
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05/18/2010
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Application #:
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12134919
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Filing Dt:
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06/06/2008
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Publication #:
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Pub Dt:
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12/25/2008
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Title:
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COMPOSITE CHARGED-PARTICLE BEAM SYSTEM
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Patent #:
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Issue Dt:
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12/01/2009
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Application #:
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12175743
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Filing Dt:
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07/18/2008
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Publication #:
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Pub Dt:
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01/29/2009
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Title:
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X-RAY TUBE AND X-RAY ANALYSIS APPARATUS
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Patent #:
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Issue Dt:
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12/15/2009
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Application #:
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12175768
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Filing Dt:
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07/18/2008
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Publication #:
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Pub Dt:
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02/12/2009
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Title:
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X-RAY TUBE AND X-RAY ANALYSIS APPARATUS
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Patent #:
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Issue Dt:
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09/28/2010
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Application #:
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12177563
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Filing Dt:
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07/22/2008
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Publication #:
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Pub Dt:
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01/08/2009
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Title:
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CHARGED-PARTICLE BEAM APPARATUS
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Patent #:
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Issue Dt:
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05/29/2012
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Application #:
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12264750
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Filing Dt:
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11/04/2008
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Publication #:
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Pub Dt:
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05/07/2009
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Title:
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METHOD OF PREPARING A TRANSMISSION ELECTRON MICROSCOPE SAMPLE AND A SAMPLE PIECE FOR A TRANSMISSION ELECTRON MICROSCOPE
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Patent #:
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Issue Dt:
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02/14/2012
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Application #:
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12276740
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Filing Dt:
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11/24/2008
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Publication #:
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Pub Dt:
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07/30/2009
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Title:
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PIEZOELECTRIC ACTUATOR PROVIDED WITH A DISPLACEMENT METER, PIEZOELECTRIC ELEMENT, AND POSITIONING DEVICE
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Patent #:
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Issue Dt:
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03/22/2011
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Application #:
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12343364
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Filing Dt:
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12/23/2008
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Publication #:
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Pub Dt:
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07/23/2009
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Title:
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X-RAY ANALYZER
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Patent #:
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Issue Dt:
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11/24/2009
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Application #:
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12369062
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Filing Dt:
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02/11/2009
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Publication #:
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Pub Dt:
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08/27/2009
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Title:
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X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
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Patent #:
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Issue Dt:
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05/17/2011
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Application #:
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12415237
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Filing Dt:
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03/31/2009
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Publication #:
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Pub Dt:
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10/08/2009
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Title:
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APPARATUS STRUCTURE AND SCANNING PROBE MICROSCOPE INCLUDING APPARATUS STRUCTURE
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Patent #:
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Issue Dt:
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05/17/2011
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Application #:
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12416634
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Filing Dt:
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04/01/2009
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Publication #:
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Pub Dt:
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10/22/2009
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Title:
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SENSOR FOR OBSERVATIONS IN LIQUID ENVIRONMENTS AND OBSERVATION APPARATUS FOR USE IN LIQUID ENVIRONMENTS
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Patent #:
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Issue Dt:
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11/29/2011
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Application #:
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12494851
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Filing Dt:
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06/30/2009
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Publication #:
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Pub Dt:
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01/07/2010
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Title:
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X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
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Patent #:
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Issue Dt:
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07/23/2013
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Application #:
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12510794
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Filing Dt:
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07/28/2009
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Publication #:
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Pub Dt:
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02/04/2010
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Title:
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PROBE ALIGNING METHOD FOR PROBE MICROSCOPE AND PROBE MICROSCOPE OPERATED BY THE SAME
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Patent #:
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Issue Dt:
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06/28/2011
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Application #:
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12544562
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Filing Dt:
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08/20/2009
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Publication #:
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Pub Dt:
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02/25/2010
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Title:
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X-RAY ANALYZER AND X-RAY ANALYSIS METHOD
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Patent #:
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Issue Dt:
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08/16/2011
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Application #:
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12544572
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Filing Dt:
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08/20/2009
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Publication #:
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Pub Dt:
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02/25/2010
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Title:
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X-RAY ANALYZER AND X-RAY ANALYSIS METHOD
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Patent #:
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Issue Dt:
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10/02/2012
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12544586
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Filing Dt:
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08/20/2009
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Publication #:
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Pub Dt:
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02/25/2010
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Title:
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ELEMENT MAPPING APPARATUS AND ELEMENT MAPPING IMAGE DISPLAY METHOD
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Patent #:
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Issue Dt:
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05/06/2014
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12548638
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Filing Dt:
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08/27/2009
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Publication #:
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Pub Dt:
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03/04/2010
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Title:
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CANTILEVER, CANTILEVER SYSTEM, AND PROBE MICROSCOPE AND ADSORPTION MASS SENSOR INCLUDING THE CANTILEVER SYSTEM
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Issue Dt:
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04/23/2013
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12613107
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11/05/2009
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Pub Dt:
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06/24/2010
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Title:
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FOCUSED ION BEAM APPARATUS, SAMPLE PROCESSING METHOD USING THE SAME, AND COMPUTER PROGRAM FOR FOCUSED ION BEAM PROCESSING
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Patent #:
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Issue Dt:
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09/20/2011
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12700236
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02/04/2010
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Pub Dt:
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08/12/2010
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Title:
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APPROACH METHOD FOR PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPE
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Issue Dt:
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11/12/2013
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12707024
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02/17/2010
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08/26/2010
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Title:
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FOCUSED ION BEAM SYSTEM AND SAMPLE PROCESSING METHOD USING THE SAME
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11/06/2012
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12708896
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02/19/2010
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08/26/2010
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Title:
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MICRO CROSS-SECTION PROCESSING METHOD
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08/20/2013
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12712863
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02/25/2010
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09/02/2010
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FOCUSED ION BEAM APPARATUS
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04/02/2013
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12813049
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06/10/2010
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03/03/2011
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X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
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09/24/2013
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12880626
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09/13/2010
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03/17/2011
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METHOD AND APPARATUS FOR CROSS-SECTION PROCESSING AND OBSERVATION
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07/30/2013
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13016202
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01/28/2011
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08/04/2011
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DIFFERENTIAL SCANNING CALORIMETER
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04/22/2014
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13027881
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02/15/2011
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08/25/2011
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12/17/2013
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13174058
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06/30/2011
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03/01/2012
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X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYSIS METHOD
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03/17/2015
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13402030
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02/22/2012
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08/30/2012
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VISCOELASTICITY MEASURING APPARATUS
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10/01/2013
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13403277
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02/23/2012
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09/13/2012
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X-RAY ANALYZER
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11/12/2013
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13545197
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07/10/2012
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03/07/2013
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Title:
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METHOD OF DETERMINING A SPRING CONSTANT OF A CANTILEVER AND SCANNING PROBE MICROSCOPE USING THE METHOD
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