Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 033863/0771 | |
| Pages: | 4 |
| | Recorded: | 10/01/2014 | | |
| Attorney Dkt #: | 13139D |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
NONE
|
Issue Dt:
|
|
Application #:
|
14503888
|
Filing Dt:
|
10/01/2014
|
|
Publication #:
|
|
Pub Dt:
|
02/26/2015
| | | | |
|
Title:
|
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, METHOD OF FABRICATING SEMICONDUCTOR DEVICE, AND INSPECTION TOOL
|
|
|
Assignee
|
|
|
|
|
| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
|
|
Correspondence name and address
|
| |
HOLTZ, HOLTZ, GOODMAN & CHICK PC
|
| |
220 FIFTH AVENUE
|
| |
16TH FLOOR
|
| |
NEW YORK, NY 10001-7708
|
Search Results as of:
04/23/2024 04:28 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
