Patent Assignment Details
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| Reel/Frame: | 034825/0673 | |
| Pages: | 2 |
| | Recorded: | 01/28/2015 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/06/2018
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Application #:
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14411915
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Filing Dt:
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12/30/2014
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Publication #:
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Pub Dt:
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06/18/2015
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Title:
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METHODS FOR INSPECTING SEMICONDUCTOR WAFERS
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Assignee
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| UNIT 26, 198-222 YOUNG STREET |
| WATERLOO, NEW SOUTH WALES, AUSTRALIA 2017 |
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Correspondence name and address
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GRAHAM ATKINS
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PO BOX 3008
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REDFERN, NSW, 2016 AUSTRALIA
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