Patent Assignment Details
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| Reel/Frame: | 035179/0609 | |
| Pages: | 3 |
| | Recorded: | 03/17/2015 | | |
| Attorney Dkt #: | P47335 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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10/10/2017
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Application #:
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14657333
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Filing Dt:
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03/13/2015
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Publication #:
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Pub Dt:
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07/02/2015
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Title:
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WAFER DEFECT INSPECTION APPARATUS AND METHOD FOR INSPECTING A WAFER DEFECT
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Assignee
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| 2-1, SHIBAURA 1-CHOME, MINATO-KU, |
| TOKYO, JAPAN 105-8634 |
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Correspondence name and address
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GREENBLUM & BERNSTEIN, P.L.C.
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1950 ROLAND CLARKE PLACE
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RESTON, VA 20191
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