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Patent Assignment Details
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Reel/Frame:035329/0612   Pages: 17
Recorded: 04/03/2015
Attorney Dkt #:T&A-GENERAL Z-2016
Conveyance: MERGER (SEE DOCUMENT FOR DETAILS).
Total properties: 2
1
Patent #:
Issue Dt:
10/30/2001
Application #:
09196438
Filing Dt:
11/20/1998
Title:
SEMICONDUCTOR TESTING APPARATUS FOR TESTING SEMICONDUCTOR DEVICE INCLUDING BUILT IN SELF TEST CIRCUIT
2
Patent #:
Issue Dt:
06/24/2003
Application #:
09860608
Filing Dt:
05/21/2001
Publication #:
Pub Dt:
09/13/2001
Title:
SEMICONDUCTOR TESTING APPARATUS FOR TESTING SEMICONDUCTOR DEVICE INCLUDING BUILT IN SELF TEST CIRCUIT
Assignor
1
Exec Dt:
04/01/2014
Assignee
1
9-1, SEIRAN 2-CHOME
OTSU-SHI, SHIGA, JAPAN
Correspondence name and address
MATTINGLY & MALUR, PC
1800 DIAGONAL ROAD
SUITE 370
ALEXANDRIA, VA 22314

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