Patent Assignment Details
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| Reel/Frame: | 035698/0970 | |
| Pages: | 3 |
| | Recorded: | 05/22/2015 | | |
| Attorney Dkt #: | 8375-000140-US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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01/10/2017
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Application #:
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14719771
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Filing Dt:
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05/22/2015
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Publication #:
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Pub Dt:
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11/26/2015
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Title:
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CALIBRATION CURVE FORMATION METHOD, IMPURITY CONCENTRATION MEASUREMENT METHOD, AND SEMICONDUCTOR WAFER MANUFACTURING METHOD
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Assignee
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| 6-861-5, SEIRO-MACHI |
| HIGASHIKO, KITAKANBARA-GUN |
| NIIGATA, JAPAN 957-0197 |
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Correspondence name and address
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G. GREGORY SCHIVLEY
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P.O. BOX 828
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BLOOMFIELD HILLS, MI 48303
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