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Reel/Frame:035870/0593   Pages: 6
Recorded: 06/19/2015
Attorney Dkt #:KLA1P216C1/P4030C1
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
04/12/2016
Application #:
14745047
Filing Dt:
06/19/2015
Publication #:
Pub Dt:
10/08/2015
Title:
MULTIPLE ANGLES OF INCIDENCE SEMICONDUCTOR METROLOGY SYSTEMS AND METHODS
Assignors
1
Exec Dt:
09/23/2013
2
Exec Dt:
09/20/2013
3
Exec Dt:
09/20/2013
4
Exec Dt:
09/30/2013
5
Exec Dt:
09/23/2013
6
Exec Dt:
09/21/2013
7
Exec Dt:
09/23/2013
8
Exec Dt:
09/23/2013
9
Exec Dt:
09/23/2013
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
KWAN & OLYNICK LLP
2000 HEARST AVENUE, SUITE 305
BERKELEY, CA 94709

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