Patent Assignment Details
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| Reel/Frame: | 035877/0304 | |
| Pages: | 3 |
| | Recorded: | 06/22/2015 | | |
| Attorney Dkt #: | 455076US99PCT |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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10/02/2018
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Application #:
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14654736
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Filing Dt:
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06/22/2015
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Publication #:
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Pub Dt:
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12/24/2015
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Title:
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EVALUATION METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, QUALITY CONTROL METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, AND EVALUATION ELEMENT AND EVALUATION DEVICE USED IN THE EVALUATION METHOD
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Assignee
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| 2-4, WAKINOHAMA-KAIGANDORI 2-CHOME, CHUO-KU |
| KOBE-SHI, HYOGO, JAPAN 651-8585 |
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Correspondence name and address
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OBLON, ET AL.
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1940 DUKE STREET
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ALEXANDRIA, VA 22314
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