Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
| Reel/Frame: | 037431/0760 | |
| Pages: | 3 |
| | Recorded: | 01/07/2016 | | |
| Attorney Dkt #: | 078697.00015 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
|
|
Total properties:
1
|
|
|
|
Patent #:
|
|
Issue Dt:
|
05/23/2017
|
Application #:
|
14990233
|
Filing Dt:
|
01/07/2016
|
|
Publication #:
|
|
Pub Dt:
|
07/14/2016
| | | | |
|
Title:
|
SYSTEM AND METHOD FOR SEMICONDUCTOR WAFER INSPECTION AND METROLOGY
|
|
|
Assignee
|
|
|
|
|
| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
|
|
Correspondence name and address
|
| |
NATHANIEL LUCEK
|
| |
HODGSON RUSS LLP
|
| |
140 PEARL ST., SUITE 100
|
| |
BUFFALO, NY 14202
|
Search Results as of:
05/14/2024 04:25 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
