skip navigationU S P T O SealUnited States Patent and Trademark Office AOTW logo
Home|Site Index|Search|Guides|Contacts|eBusiness|eBiz alerts|News|Help
Assignments on the Web > Patent Query
Patent Assignment Details
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:038230/0553   Pages: 3
Recorded: 04/08/2016
Attorney Dkt #:BUR920130036US2
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
06/05/2018
Application #:
15094220
Filing Dt:
04/08/2016
Publication #:
Pub Dt:
08/04/2016
Title:
TEST PATTERN LAYOUT FOR TEST PHOTOMASK AND METHOD FOR EVALUATING CRITICAL DIMENSION CHANGES
Assignor
1
Exec Dt:
01/23/2014
Assignee
1
1-5-1 TAITO, TAITO-KU
TOKYO, JAPAN 110-8560
Correspondence name and address
HOFFMAN WARNICK LLC
540 BROADWAY
ALBANY, NY 12207

Search Results as of: 05/22/2024 11:22 AM
If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified: August 25, 2017 v.2.6
| .HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY STATEMENT