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Reel/Frame:039741/0264   Pages: 5
Recorded: 09/14/2016
Attorney Dkt #:KLA1P260_P4720
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
12/03/2019
Application #:
15192962
Filing Dt:
06/24/2016
Publication #:
Pub Dt:
12/29/2016
Title:
METHODS AND APPARATUS FOR MEASURING HEIGHT ON A SEMICONDUCTOR WAFER
Assignors
1
Exec Dt:
07/18/2016
2
Exec Dt:
07/20/2016
Assignee
1
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondence name and address
KWAN & OLYNICK LLP
2000 HEARST AVENUE, SUITE 305
BERKELEY, CA 94709

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