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Patent Assignment Details

NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:	039884/0004			Pages:	26
		Recorded:	08/30/2016
Conveyance:	SECURITY INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 31

Patent #:	6798693	Issue Dt:	09/28/2004	Application #:	09955641	Filing Dt:	09/18/2001
Publication #:	US20040008538	Pub Dt:	01/15/2004
Title:	SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A BREAKDOWN PHENOMENA IN AN ULTRA-THIN DIELECTRIC

Patent #:	6766960	Issue Dt:	07/27/2004	Application #:	09982034	Filing Dt:	10/17/2001
Publication #:	US20040031853	Pub Dt:	02/19/2004
Title:	SMART CARD HAVING MEMORY USING A BREAKDOWN PHENOMENA IN AN ULTRA-THIN DIELECTRIC

Patent #:	6700151	Issue Dt:	03/02/2004	Application #:	09982314	Filing Dt:	10/17/2001
Publication #:	US20030071315	Pub Dt:	04/17/2003
Title:	REPROGRAMMABLE NON-VOLATILE MEMORY USING A BREAKDOWN PHENOMENA IN AN ULTRA-THIN DIELECTRIC

Patent #:	6667902	Issue Dt:	12/23/2003	Application #:	10024327	Filing Dt:	12/17/2001
Publication #:	US20030198085	Pub Dt:	10/23/2003
Title:	SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A BREAKDOWN PHENOMENA IN AN ULTRA-THIN DIELECTRIC

Patent #:	6777757	Issue Dt:	08/17/2004	Application #:	10133704	Filing Dt:	04/26/2002
Publication #:	US20030202376	Pub Dt:	10/30/2003
Title:	HIGH DENSITY SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A SINGLE TRANSISTOR

Patent #:	6671040	Issue Dt:	12/30/2003	Application #:	10256483	Filing Dt:	09/26/2002
Publication #:	US20030063518	Pub Dt:	04/03/2003
Title:	PROGRAMMING METHODS AND CIRCUITS FOR SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A BREAKDOWN PHENOMENA IN AN ULTRA-THIN DIELECTRIC

Patent #:	6956258	Issue Dt:	10/18/2005	Application #:	10264212	Filing Dt:	10/03/2002
Publication #:	US20030071296	Pub Dt:	04/17/2003
Title:	REPROGRAMMABLE NON-VOLATILE MEMORY USING A BREAKDOWN PHENOMENA IN AN ULTRA-THIN DIELECTRIC

Patent #:	6791891	Issue Dt:	09/14/2004	Application #:	10406406	Filing Dt:	04/02/2003
Title:	METHOD OF TESTING THE THIN OXIDE OF A SEMICONDUCTOR MEMORY CELL THAT USES BREAKDOWN VOLTAGE

Patent #:	6856540	Issue Dt:	02/15/2005	Application #:	10448505	Filing Dt:	05/30/2003
Publication #:	US20030206467	Pub Dt:	11/06/2003
Title:	HIGH DENSITY SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A SINGLE TRANSISTOR

Patent #:	6822888	Issue Dt:	11/23/2004	Application #:	10639041	Filing Dt:	08/11/2003
Publication #:	US20040047218	Pub Dt:	03/11/2004
Title:	SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A BREAKDOWN PHENOMENA IN AN ULTRA-THIN DIELECTRIC

Patent #:	6898116	Issue Dt:	05/24/2005	Application #:	10677613	Filing Dt:	10/02/2003
Publication #:	US20040125671	Pub Dt:	07/01/2004
Title:	HIGH DENSITY SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A SINGLE TRANSISTOR HAVING A BURIED N+ CONNECTION

Patent #:	6940751	Issue Dt:	09/06/2005	Application #:	10765802	Filing Dt:	01/26/2004
Publication #:	US20040156234	Pub Dt:	08/12/2004
Title:	HIGH DENSITY SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A SINGLE TRANSISTOR AND HAVING VARIABLE GATE OXIDE BREAKDOWN

Patent #:	7031209	Issue Dt:	04/18/2006	Application #:	10796270	Filing Dt:	03/09/2004
Publication #:	US20040208055	Pub Dt:	10/21/2004
Title:	METHODS AND CIRCUITS FOR TESTING PROGRAMMABILITY OF A SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A BREAKDOWN PHENOMENON IN AN ULTRA-THIN DIELECTRIC

Patent #:	6992925	Issue Dt:	01/31/2006	Application #:	10798753	Filing Dt:	03/10/2004
Publication #:	US20040223363	Pub Dt:	11/11/2004
Title:	HIGH DENSITY SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A SINGLE TRANSISTOR AND HAVING COUNTER-DOPED POLY AND BURIED DIFFUSION WORDLINE

Patent #:	7042772	Issue Dt:	05/09/2006	Application #:	10859934	Filing Dt:	06/02/2004
Publication #:	US20040223370	Pub Dt:	11/11/2004
Title:	METHODS AND CIRCUITS FOR PROGRAMMING OF A SEMICONDUCTOR MEMORY CELL AND MEMORY ARRAY USING A BREAKDOWN PHENOMENON IN AN ULTRA-THIN DIELECTRIC

Patent #:	7173851	Issue Dt:	02/06/2007	Application #:	11252461	Filing Dt:	10/18/2005
Title:	3.5 TRANSISTOR NON-VOLATILE MEMORY CELL USING GATE BREAKDOWN PHENOMENA

Patent #:	7269047	Issue Dt:	09/11/2007	Application #:	11368576	Filing Dt:	03/06/2006
Publication #:	US20070206417	Pub Dt:	09/06/2007
Title:	MEMORY TRANSISTOR GATE OXIDE STRESS RELEASE AND IMPROVED RELIABILITY

Patent #:	7471540	Issue Dt:	12/30/2008	Application #:	11657982	Filing Dt:	01/24/2007
Publication #:	US20080175060	Pub Dt:	07/24/2008
Title:	NON-VOLATILE SEMICONDUCTOR MEMORY BASED ON ENHANCED GATE OXIDE BREAKDOWN

Patent #:	7609539	Issue Dt:	10/27/2009	Application #:	11699916	Filing Dt:	01/29/2007
Publication #:	US20070183181	Pub Dt:	08/09/2007
Title:	ELECTRICALLY PROGRAMMABLE FUSE BIT

Patent #:	7471541	Issue Dt:	12/30/2008	Application #:	11759050	Filing Dt:	06/06/2007
Publication #:	US20070230232	Pub Dt:	10/04/2007
Title:	MEMORY TRANSISTOR GATE OXIDE STRESS RELEASE AND IMPROVED RELIABILITY

Patent #:	7586787	Issue Dt:	09/08/2009	Application #:	11858515	Filing Dt:	09/20/2007
Publication #:	US20090080275	Pub Dt:	03/26/2009
Title:	REDUCING BIT LINE LEAKAGE CURRENT IN NON-VOLATILE MEMORIES

Patent #:	8116145	Issue Dt:	02/14/2012	Application #:	12202048	Filing Dt:	08/29/2008
Publication #:	US20100054048	Pub Dt:	03/04/2010
Title:	METHOD AND APPARATUS FOR PROGRAMMING AUTO SHUT-OFF

Patent #:	7623368	Issue Dt:	11/24/2009	Application #:	12330465	Filing Dt:	12/08/2008
Publication #:	US20090085127	Pub Dt:	04/02/2009
Title:	NON-VOLATILE SEMICONDUCTOR MEMORY BASED ON ENHANCED GATE OXIDE BREAKDOWN

Patent #:	7907465	Issue Dt:	03/15/2011	Application #:	12577084	Filing Dt:	10/09/2009
Publication #:	US20100091545	Pub Dt:	04/15/2010
Title:	ELECTRICALLY PROGRAMMABLE FUSE BIT

Patent #:	8283731	Issue Dt:	10/09/2012	Application #:	12802206	Filing Dt:	06/02/2010
Publication #:	US20110298054	Pub Dt:	12/08/2011
Title:	ONE-TIME PROGRAMMABLE MEMORY

Patent #:	8330189	Issue Dt:	12/11/2012	Application #:	12819566	Filing Dt:	06/21/2010
Publication #:	US20110309421	Pub Dt:	12/22/2011
Title:	ONE-TIME PROGRAMMABLE MEMORY AND METHOD FOR MAKING THE SAME

Patent #:	9230813	Issue Dt:	01/05/2016	Application #:	14250267	Filing Dt:	04/10/2014
Publication #:	US20140217484	Pub Dt:	08/07/2014
Title:	ONE-TIME PROGRAMMABLE MEMORY AND METHOD FOR MAKING THE SAME

Patent #:	9431254	Issue Dt:	08/30/2016	Application #:	14681852	Filing Dt:	04/08/2015
Publication #:	US20150311215	Pub Dt:	10/29/2015
Title:	One-Time Programmable Memory and Method for Making the Same

Patent #:	9548131	Issue Dt:	01/17/2017	Application #:	15152463	Filing Dt:	05/11/2016
Publication #:	US20170025186	Pub Dt:	01/26/2017
Title:	Reduced Power Read Sensing for One-Time Programmable Memories

Patent #:	9852805	Issue Dt:	12/26/2017	Application #:	15154911	Filing Dt:	05/13/2016
Publication #:	US20160379720	Pub Dt:	12/29/2016
Title:	Write Enhancement for One Time Programmable (OTP) Semiconductors

Patent #:	9633703	Issue Dt:	04/25/2017	Application #:	15188166	Filing Dt:	06/21/2016
Publication #:	US20170011781	Pub Dt:	01/12/2017
Title:	Semiconductor Memory Sensing Architecture

Assignor

KILOPASS TECHNOLOGY, INC.

Exec Dt:

08/30/2016

Assignee

STRUCTURAL CAPITAL INVESTMENTS II, LP

3555 ALAMEDA DE LAS PULGAS, SUITE 208

MENLO PARK, CALIFORNIA 94025

Correspondence name and address
	BUNNIE POULLARD
	9720 WILSHIRE BLVD
	5TH FLOOR
	BEVERLY HILLS, CA 90212

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