Patent Assignment Details
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For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 039943/0232 | |
| Pages: | 2 |
| | Recorded: | 09/07/2016 | | |
| Attorney Dkt #: | SILT019DIV /152723-127937 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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08/01/2017
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Application #:
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15258959
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Filing Dt:
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09/07/2016
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Publication #:
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Pub Dt:
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03/09/2017
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Title:
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APPARATUS FOR MEASURING IMPURITIES ON WAFER AND METHOD OF MEASURING IMPURITIES ON WAFER
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Assignee
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| 274, IMSU-DONG, GUMI-SI |
| GYEONGBUK, KOREA, REPUBLIC OF 730-350 |
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Correspondence name and address
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LEWIS ROCA ROTHGERBER CHRISTIE LLP
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PO BOX 29001
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GLENDALE, CA 91209-9001
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