Patent Assignment Details
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| Reel/Frame: | 040470/0733 | |
| Pages: | 3 |
| | Recorded: | 11/30/2016 | | |
| Attorney Dkt #: | 479695US |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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10/03/2017
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Application #:
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15315287
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Filing Dt:
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11/30/2016
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Publication #:
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Pub Dt:
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07/06/2017
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Title:
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METHOD FOR EVALUATING QUALITY OF OXIDE SEMICONDUCTOR THIN FILM AND LAMINATED BODY HAVING PROTECTIVE FILM ON SURFACE OF OXIDE SEMICONDUCTOR THIN FILM, AND METHOD FOR MANAGING QUALITY OF OXIDE SEMICONDUCTOR THIN FILM
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Assignee
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| 2-4, WAKINOHAMA-KAIGANDORI 2-CHOME, CHUO-KU |
| KOBE-SHI, HYOGO, JAPAN 651-8585 |
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Correspondence name and address
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OBLON, ET AL.
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1940 DUKE STREET
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ALEXANDRIA, VA 22314
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