Patent Assignment Details
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| Reel/Frame: | 041282/0747 | |
| Pages: | 2 |
| | Recorded: | 02/17/2017 | | |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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11/05/2019
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Application #:
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15249474
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Filing Dt:
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08/29/2016
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Publication #:
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Pub Dt:
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03/02/2017
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Title:
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SCANNING PROBE MICROSCOPE AND OPTICAL AXIS ADJUSTMENT METHOD FOR SCANNING PROBE MICROSCOPE
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Assignee
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| 24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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Correspondence name and address
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HIROYOSHI TEROAKA
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7-13, NISHI-SHIMBASHI 1-CHOME, MINATO-KU
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TOKYO, JAPAN
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