Patent Assignment Details
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| Reel/Frame: | 041971/0785 | |
| Pages: | 9 |
| | Recorded: | 04/11/2017 | | |
| Attorney Dkt #: | KLA P5007 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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07/07/2020
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Application #:
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15394545
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Filing Dt:
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12/29/2016
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Publication #:
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Pub Dt:
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05/10/2018
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Title:
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System and Method for Generation of Wafer Inspection Critical Areas
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Assignee
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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Correspondence name and address
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SUITER SWANTZ/KLA JOINT CUSTOMER NUMBER
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14301 FNB PARKWAY
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SUITE 220
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OMAHA, NE 68154-5299
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