Patent Assignment Details
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| Reel/Frame: | 042420/0507 | |
| Pages: | 5 |
| | Recorded: | 05/18/2017 | | |
| Attorney Dkt #: | Q232562 (JTC) |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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09/01/2020
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Application #:
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15586526
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Filing Dt:
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05/04/2017
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Publication #:
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Pub Dt:
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08/17/2017
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Title:
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SEMICONDUCTOR WAFER AND METHOD OF INSPECTING SEMICONDUCTOR WAFER
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Assignee
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| 27-1, SHINKAWA 2-CHOME |
| CHUO-KU, TOKYO, JAPAN 104-8260 |
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Correspondence name and address
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SUGHRUE MION, PLLC
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2100 PENNSYLVANIA AVE, NW
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SUITE 800
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WASHINGTON, DC 20037
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