Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 044664/0704 | |
| Pages: | 4 |
| | Recorded: | 01/19/2018 | | |
| Attorney Dkt #: | SEC-REL-BAM-INTERFER |
| Conveyance: | RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS). |
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Total properties:
9
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Patent #:
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Issue Dt:
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01/21/1997
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Application #:
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08408770
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Filing Dt:
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03/22/1995
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Title:
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ASSOCIATED DUAL INTERFEROMETRIC MEASUREMENT METHOD FOR DETERMINING A PHYSICAL PROPERTY OF AN OBJECT
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Patent #:
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Issue Dt:
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08/19/1997
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Application #:
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08408871
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Filing Dt:
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03/22/1995
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Title:
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ASSOCIATED DUAL INTERFEROMETRIC MEASUREMENT APPARATUS FOR DETERMINING A PHYSICAL PROPERTY OF AN OBJECT
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Patent #:
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Issue Dt:
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03/07/2000
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Application #:
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09105742
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Filing Dt:
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06/26/1998
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Title:
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METHOD FOR DETERMINING THE RETARDATION OF A MATERIAL USING NON-COHERENT LIGHT INTERFEROMETERY
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Patent #:
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Issue Dt:
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03/07/2000
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Application #:
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09216044
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Filing Dt:
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12/18/1998
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Title:
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METHOD FOR PROCESSING INTERFEROMETRIC MEASUREMENT DATA
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Patent #:
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Issue Dt:
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03/14/2000
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Application #:
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09216045
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Filing Dt:
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12/18/1998
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Title:
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METHOD FOR MEASURING MATERIAL THICKNESS PROFILES
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Patent #:
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Issue Dt:
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05/23/2000
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Application #:
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09216094
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Filing Dt:
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12/18/1998
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Title:
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APPARATUS FOR MEASURING MATERIAL THICKNESS PROFILES
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Patent #:
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Issue Dt:
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02/18/2003
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Application #:
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09521089
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Filing Dt:
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03/07/2000
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Title:
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METHOD FOR PROCESSING LOW COHERENCE INTERFEROMETRIC DATA
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Patent #:
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Issue Dt:
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09/23/2003
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Application #:
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09976654
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Filing Dt:
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10/12/2001
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Publication #:
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Pub Dt:
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04/24/2003
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Title:
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INTERFEROMETRIC-BASED EXTERNAL MEASUREMENT SYSTEM AND METHOD
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Patent #:
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Issue Dt:
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04/20/2004
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Application #:
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10163519
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Filing Dt:
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06/06/2002
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Publication #:
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Pub Dt:
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12/11/2003
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Title:
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APPARATUS AND METHOD FOR MEASURING DIGITAL IMAGER, PACKAGE AND WAFER BOW AND DEVIATION FROM FLATNESS
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Assignee
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| 343 STATE STREET |
| ROCHESTER, NEW YORK 14650 |
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Correspondence name and address
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EASTMAN KODAK COMPANY
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343 STATE STREET
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ROCHESTER, NY 14650-2201
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