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Patent Assignment Details

NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Reel/Frame:	045467/0534			Pages:	18
		Recorded:	04/06/2018
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 10

1

Patent #:	10211112	Issue Dt:	02/19/2019	Application #:	15936759	Filing Dt:	03/27/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Tip-to-Tip Short or Leakage, at Least One Tip-to-Side Short or Leakage, and at Least One Side-to-Side Short or Leakage, Where Such Measurements Are Obtained from Non-Contact Pads Associated with Respective Tip-to-Tip Short, Tip-to-Side Short, and Side-to-Side Short Test Areas

2

Patent #:	10199284	Issue Dt:	02/05/2019	Application #:	15936825	Filing Dt:	03/27/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Tip-to-Tip Short or Leakage, at Least One Tip-to-Side Short or Leakage, and at Least One Chamfer Short or Leakage, Where Such Measurements Are Obtainedfrom Non-Contact Pads Associated with Respective Tip-to-Tip Short, Tip-to-Side Short, and Chamfer Short Test Areas

3

Patent #:	10211111	Issue Dt:	02/19/2019	Application #:	15936934	Filing Dt:	03/27/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Tip-to-Tip Short or Leakage, at Least One Tip-to-Side Short or Leakage, and at Least One Corner Short or Leakage, Where Such Measurements Are Obtained from Non-Contact Pads Associated with Respective Tip-to-Tip Short, Tip-to-Side Short, and Corner Short Test Areas

4

Patent #:	10199293	Issue Dt:	02/05/2019	Application #:	15937182	Filing Dt:	03/27/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Tip-to-Tip Short or Leakage, at Least One Side-to-Side Short or Leakage, and at Least One Chamfer Short or Leakage, Where Such Measurements Are Obtained from Non-Contact Pads Associated with Respective Tip-to-Tip Short, Side-to-Side Short, and Chamfer Short Test Areas

5

Patent #:	10199285	Issue Dt:	02/05/2019	Application #:	15937356	Filing Dt:	03/27/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Tip-to-Tip Short or Leakage, at Least One Side-to-Side Short or Leakage, and at Least One Via Open or Resistance, Where Such Measurements Are Obtained from Non-Contact Pads Associated with Respective Tip-to-Tip Short, Side-to-Side Short, and Via Open Test Areas

6

Patent #:	10199286	Issue Dt:	02/05/2019	Application #:	15942470	Filing Dt:	03/31/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Tip-to-Side Short or Leakage, at Least One Chamfer Short or Leakage, and at Least One Corner Short or Leakage, Where Such Measurements Are Obtained from Non-Contact Pads Associated with Respective Tip-to-Side Short, Chamfer Short, and Corner Short Test Areas

7

Patent #:	10199287	Issue Dt:	02/05/2019	Application #:	15942473	Filing Dt:	03/31/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Tip-to-Side Short or Leakage, at Least One Chamfer Short or Leakage, and at Least One Via Open or Resistance, Where Such Measurements Are Obtained fromNon-Contact Pads Associated with Respective Tip-to-Side Short, Chamfer Short, and Via Open Test Areas

8

Patent #:	10854522	Issue Dt:	12/01/2020	Application #:	15942475	Filing Dt:	03/31/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Tip-to-Side Short or Leakage, at Least One Corner Short or Leakage, and at Least One Via Open or Resistance, Where Such Measurements Are Obtained from Non-Contact Pads Associated with Respective Tip-to-Side Short, Corner Short, and Via Open Test Areas

9

Patent #:	10199288	Issue Dt:	02/05/2019	Application #:	15942483	Filing Dt:	03/31/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Side-to-Side Short or Leakage, at Least One Corner Short or Leakage, and at Least One Via Open or Resistance, Where Such Measurements Are Obtained fromNon-Contact Pads Associated with Respective Side-to-Side Short, Corner Short, and Via Open Test Areas

10

Patent #:	10199289	Issue Dt:	02/05/2019	Application #:	15942485	Filing Dt:	03/31/2018
Title:	Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of at Least One Chamfer Short or Leakage, at Least One Corner Short or Leakage, and at Least One Via Open or Resistance, Where Such Measurements Are Obtained from Non-Contact Pads Associated with Respective Chamfer Short, Corner Short, and Via Open Test Areas

Assignors

1

Exec Dt:

04/21/2016

2

CIPLICKAS, DENNIS

Exec Dt:

04/15/2016

3

Exec Dt:

04/20/2016

4

Exec Dt:

05/06/2016

5

COMENSOLI, SIMONE

Exec Dt:

04/13/2016

6

Exec Dt:

04/12/2016

7

Exec Dt:

04/28/2016

8

EISENMANN, HANS

Exec Dt:

04/26/2016

9

FISCUS, TIMOTHY

Exec Dt:

04/13/2016

10

HAIGH, JONATHAN

Exec Dt:

04/13/2016

11

HESS, CHRISTOPHER

Exec Dt:

04/12/2016

12

Exec Dt:

04/18/2016

13

Exec Dt:

04/14/2016

14

Exec Dt:

04/15/2016

15

Exec Dt:

04/28/2016

16

MATSUHASHI, HIDEKI

Exec Dt:

04/25/2016

17

MICHAELS, KIMON

Exec Dt:

04/18/2016

18

O'SULLIVAN, CONOR

Exec Dt:

04/21/2016

19

RAUSCHER, MARKUS

Exec Dt:

04/26/2016

20

ROVNER, VYACHESLAV

Exec Dt:

04/13/2016

21

STROJWAS, ANDRZEJ

Exec Dt:

04/28/2016

22

STROJWAS, MARCIN

Exec Dt:

04/13/2016

23

Exec Dt:

04/13/2016

24

VALLISHAYEE, RAKESH

Exec Dt:

04/12/2016

25

Exec Dt:

04/21/2016

26

YOKOYAMA, NOBUHARU

Exec Dt:

04/13/2016

Assignee

1

PDF SOLUTIONS, INC.

333 W. SAN CARLOS ST.

STE 1000

SAN JOSE, CALIFORNIA 95110

Correspondence name and address
	DAVID GARROD, PH.D., ESQ.
	711 IVY STREET
	PITTSBURGH, PA 15232

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